Weiwei DENG

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Halo test method for an optical chip in an integrated circuit
- Patent number 10,977,469
- Issue date Apr 13, 2021
- Sino IC Technology Co., Ltd.
- Hua Wang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
HALO TEST METHOD FOR AN OPTICAL CHIP IN AN INTEGRATED CIRCUIT
- Publication number 20200311375
- Publication date Oct 1, 2020
- Sino IC Technology Co.,Ltd.
- Hua WANG
- G06 - COMPUTING CALCULATING COUNTING