WEIWEI PAN

Follow

Person

Hangzhou, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Addressable test chip
- Patent number 11,668,748
- Issue date Jun 6, 2023
- SEMITRONIX CORPORATION
- Fan Lan
- G01 - MEASURING TESTING
Information Patent Grant
Temperature sensor
- Patent number 11,274,971
- Issue date Mar 15, 2022
- SEMITRONIX CORPORATION
- Zhong Tang
- G01 - MEASURING TESTING
Information Patent Grant
Addressable test system with address register
- Patent number 11,243,251
- Issue date Feb 8, 2022
- SEMITRONIX CORPORATION
- Fan Lan
- G01 - MEASURING TESTING
Information Patent Grant
Addressable test chip test system
- Patent number 10,254,339
- Issue date Apr 9, 2019
- SEMITRONIX CORPORATION
- Fan Lan
- G01 - MEASURING TESTING
Information Patent Grant
Addressable ring oscillator test chip
- Patent number 10,156,605
- Issue date Dec 18, 2018
- Semitronix Corporation
- Weiwei Pan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Addressable test circuit and test method for key parameters of tran...
- Patent number 9,817,058
- Issue date Nov 14, 2017
- SEMITRONIX CORPORATION
- Weiwei Pan
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
ADDRESSABLE TEST CHIP
- Publication number 20220146573
- Publication date May 12, 2022
- Semitronix Corporation
- Fan LAN
- G01 - MEASURING TESTING
Information Patent Application
ADDRESSABLE TEST SYSTEM WITH ADDRESS REGISTER
- Publication number 20200355742
- Publication date Nov 12, 2020
- Semitronix Corporation
- Fan LAN
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE SENSOR
- Publication number 20200209070
- Publication date Jul 2, 2020
- Semitronix Corporation
- Zhong TANG
- G01 - MEASURING TESTING
Information Patent Application
ADDRESSABLE TEST CHIP TEST SYSTEM
- Publication number 20180188324
- Publication date Jul 5, 2018
- Semitronix Corporation
- Fan LAN
- G01 - MEASURING TESTING
Information Patent Application
Addressable test circuit and test method for key parameters of tran...
- Publication number 20170059645
- Publication date Mar 2, 2017
- Semitronix Corporation
- WEIWEI PAN
- G01 - MEASURING TESTING
Information Patent Application
ADDRESSABLE RING OSCILLATOR TEST CHIP
- Publication number 20160061895
- Publication date Mar 3, 2016
- Semitronix Corporation
- Weiwei Pan
- G01 - MEASURING TESTING
Information Patent Application
Addressable test circuit and test method for key parameters of tran...
- Publication number 20150042372
- Publication date Feb 12, 2015
- Semitronix Corporation
- WEIWEI PAN
- G01 - MEASURING TESTING