WEIWEI SANG

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Suzhou, CN

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit with embedded memory modules
- Patent number 11,587,636
- Issue date Feb 21, 2023
- NXP USA, INC.
- Wenbin Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for testing integrated circuit
- Patent number 9,805,826
- Issue date Oct 31, 2017
- NXP USA,INC.
- Weiwei Sang
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT WITH EMBEDDED MEMORY MODULES
- Publication number 20220199182
- Publication date Jun 23, 2022
- NXP USA, Inc.
- Wenbin Yang
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS FOR TESTING INTEGRATED CIRCUIT
- Publication number 20160365157
- Publication date Dec 15, 2016
- FREESCALE SEMICONDUCTOR, INC.
- WEIWEI SANG
- G01 - MEASURING TESTING