Weiwei ZHANG

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Brookfield, WI, US

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Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR CORRECTING UNIFORMITY OF A MAGNETIC RESONA...
- Publication number 20180120399
- Publication date May 3, 2018
- GENERAL ELECTRIC COMPANY
- Yongchuan Lai
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC RESONANCE IMAGING METHOD AND SYSTEM
- Publication number 20180059195
- Publication date Mar 1, 2018
- Yongchuan LAI
- G01 - MEASURING TESTING