Weiwei ZHAO

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method and device for measuring semiconductor multilayer structure...
- Patent number 12,165,931
- Issue date Dec 10, 2024
- SHANGHAI ASPIRING SEMICONDUCTOR EQUIPMENT CO., LTD.
- Chongji Huang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR MEASURING SEMICONDUCTOR MULTILAYER STRUCTURE...
- Publication number 20240038600
- Publication date Feb 1, 2024
- SHANGHAI ASPIRING SEMICONDUCTOR EQUIPMENT CO., LTD.
- Chongji HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MONITORING AND IMPROVING SOFTWARE DEVELOPMENT QUALITY
- Publication number 20140123110
- Publication date May 1, 2014
- BUSINESS OBJECTS SOFTWARE LIMITED
- Deng Feng WAN
- G06 - COMPUTING CALCULATING COUNTING