Weiwen Xu

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Indirect determination of dynamic dark level of an imaging device
- Patent number 11,423,575
- Issue date Aug 23, 2022
- Tokyo Electron Limited
- Feng Ma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for in-situ film stack measurement during etching and etch c...
- Patent number 9,059,038
- Issue date Jun 16, 2015
- Tokyo Electron Limited
- Shifang Li
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR IN-SITU FILM STACK MEASUREMENT DURING ETCHING AND ETCH C...
- Publication number 20140024143
- Publication date Jan 23, 2014
- TOKYO ELECTRON LIMITED
- Shifang LI
- H01 - BASIC ELECTRIC ELEMENTS