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Patents Grantslast 30 patents

Information Patent Grant
Determining pattern ranking based on measurement feedback from prin...
- Patent number 12,038,694
- Issue date Jul 16, 2024
- ASML Netherlands B.V.
- Youping Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Determining pattern ranking based on measurement feedback from prin...
- Patent number 11,635,699
- Issue date Apr 25, 2023
- ASML Netherlands B.V.
- Youping Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS, PRODUCTS, AND METHODS FOR IMAGE-BASED PATTERN SELECTION
- Publication number 20230273528
- Publication date Aug 31, 2023
- ASML NETHERLANDS B.V.
- Rencheng SUN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING PATTERN RANKING BASED ON MEASUREMENT FEEDBACK FROM PRIN...
- Publication number 20230236512
- Publication date Jul 27, 2023
- ASML NETHERLANDS B.V.
- Youping ZHANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DETERMINING PATTERN RANKING BASED ON MEASUREMENT FEEDBACK FROM PRIN...
- Publication number 20220043356
- Publication date Feb 10, 2022
- ASML NETHERLANDS B.V.
- Youping ZHANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DETERMINING HOT SPOT RANKING BASED ON WAFER MEASUREMENT
- Publication number 20220035256
- Publication date Feb 3, 2022
- ASML NETHERLANDS B.V.
- Youping ZHANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY