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Phoenix, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device
Patent number
11,810,976
Issue date
Nov 7, 2023
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device
Patent number
11,552,193
Issue date
Jan 10, 2023
Semiconductor Components Industries, LLC
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Process of forming an electronic device including a non-volatile me...
Patent number
11,545,583
Issue date
Jan 3, 2023
Semiconductor Components Industries, LLC
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electronic device including a junction field-effect transistor
Patent number
11,289,613
Issue date
Mar 29, 2022
Semiconductor Components Industries, LLC
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Isolation structure for semiconductor device having self-biasing bu...
Patent number
10,490,549
Issue date
Nov 26, 2019
Semiconductor Components Industries, LLC
Moshe Agam
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Isolation structure for semiconductor device having self-biasing bu...
Patent number
10,224,323
Issue date
Mar 5, 2019
Semiconductor Components Industries, LLC
Moshe Agam
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device with non-isolated power transistor with integr...
Patent number
10,032,904
Issue date
Jul 24, 2018
NXP USA, INC.
Patrice M. Parris
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Split gate device with doped region and method therefor
Patent number
10,026,820
Issue date
Jul 17, 2018
NXP USA, INC.
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated circuits devices with counter-doped conductive gates
Patent number
9,991,356
Issue date
Jun 5, 2018
NXP USA, INC.
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion sensitive field effect transistors with protection diodes and m...
Patent number
9,978,689
Issue date
May 22, 2018
NXP USA, INC.
Md M. Hoque
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and apparatus for an ISFET
Patent number
9,964,516
Issue date
May 8, 2018
NXP USA, INC.
Patrice M. Parris
G05 - CONTROLLING REGULATING
Information
Patent Grant
Method of fabricating a tunable schottky diode with depleted conduc...
Patent number
9,899,500
Issue date
Feb 20, 2018
NXP USA, INC.
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Protected sensor field effect transistors
Patent number
9,857,329
Issue date
Jan 2, 2018
NXP USA, INC.
Patrice M. Parris
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated breakdown protection
Patent number
9,818,863
Issue date
Nov 14, 2017
NXP USA, INC.
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and related protection methods
Patent number
9,780,558
Issue date
Oct 3, 2017
NXP USA, INC.
Patrice M. Parris
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Semiconductor device with false drain
Patent number
9,741,793
Issue date
Aug 22, 2017
NXP USA, INC.
Patrice M. Parris
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and driver circuit with an active device and i...
Patent number
9,704,853
Issue date
Jul 11, 2017
NXP USA, INC.
Hubert M. Bode
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated electrostatic discharge (ESD) clamping for an LDMOS tran...
Patent number
9,673,188
Issue date
Jun 6, 2017
NXP USA, INC.
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Stacked protection devices with overshoot protection and related fa...
Patent number
9,620,496
Issue date
Apr 11, 2017
NXP USA, INC.
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and driver circuit with source and isolation s...
Patent number
9,607,981
Issue date
Mar 28, 2017
NXP USA, INC.
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and apparatus for an ISFET
Patent number
9,599,587
Issue date
Mar 21, 2017
NXP USA, INC.
Patrice M. Parris
G05 - CONTROLLING REGULATING
Information
Patent Grant
Semiconductor device and driver circuit with an active device and i...
Patent number
9,570,440
Issue date
Feb 14, 2017
NXP USA, INC.
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device with non-isolated power transistor with integr...
Patent number
9,559,097
Issue date
Jan 31, 2017
NXP USA, INC.
Patrice M. Parris
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and related fabrication methods
Patent number
9,553,187
Issue date
Jan 24, 2017
NXP USA, INC.
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Enhanced sensitivity ion sensing devices
Patent number
9,541,521
Issue date
Jan 10, 2017
NXP USA, INC.
Md M. Hoque
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device with increased safe operating area
Patent number
9,537,000
Issue date
Jan 3, 2017
FREESCALE SEMICONDUCTOR, INC.
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and driver circuit with drain and isolation st...
Patent number
9,502,304
Issue date
Nov 22, 2016
FREESCALE SEMICONDUCTOR, INC.
Weize Chen
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Protected sensor field effect transistors
Patent number
9,494,550
Issue date
Nov 15, 2016
FREESCALE SEMICONDUCTOR, INC.
Patrice M. Parris
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device including power and logic devices and related...
Patent number
9,478,467
Issue date
Oct 25, 2016
FREESCALE SEMICONDUCTOR, INC.
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor structure having a dual-gate non-volatile memory devi...
Patent number
9,466,608
Issue date
Oct 11, 2016
FREESCALE SEMICONDUCTOR, INC.
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF FORMING A SEMICONDUCTOR DEVICE
Publication number
20240047578
Publication date
Feb 8, 2024
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF FORMING A SEMICONDUCTOR DEVICE
Publication number
20220262949
Publication date
Aug 18, 2022
Semiconductor Components Industries, LLC
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electronic Device Including a Non-Volatile Memory Cell and a Proces...
Publication number
20220254920
Publication date
Aug 11, 2022
Semiconductor Components Industries, LLC
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD THEREFOR
Publication number
20220209008
Publication date
Jun 30, 2022
Semiconductor Components Industries, LLC
Weize CHEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electronic Device Including a Junction Field-Effect Transistor
Publication number
20210119059
Publication date
Apr 22, 2021
Semiconductor Components Industries, LLC
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ISOLATION STRUCTURE FOR SEMICONDUCTOR DEVICE HAVING SELF-BIASING BU...
Publication number
20190148368
Publication date
May 16, 2019
Semiconductor Components Industries, LLC
Moshe AGAM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ISOLATION STRUCTURE FOR SEMICONDUCTOR DEVICE HAVING SELF-BIASING BU...
Publication number
20190043856
Publication date
Feb 7, 2019
Semiconductor Components Industries, LLC
Moshe AGAM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS FOR CONTROLLING MEMORY ARRAY POWER CONSUMPTION
Publication number
20180260014
Publication date
Sep 13, 2018
NXP USA, Inc.
Patrice M. PARRIS
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS AND SENSOR DEVICES FOR SENSING FLUID PROPERTIES
Publication number
20180059052
Publication date
Mar 1, 2018
FREESCALE SEMICONDUCTOR, INC.
Md M. HOQUE
G01 - MEASURING TESTING
Information
Patent Application
SPLIT GATE DEVICE WITH DOPED REGION AND METHOD THEREFOR
Publication number
20170278937
Publication date
Sep 28, 2017
FREESCALE SEMICONDUCTOR, INC.
WEIZE CHEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS AND APPARATUS FOR AN ISFET
Publication number
20170146485
Publication date
May 25, 2017
NXP USA, Inc.
Patrice M. Parris
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor Device with Non-Isolated Power Transistor with Integr...
Publication number
20170092760
Publication date
Mar 30, 2017
NXP USA, Inc.
Patrice M. Parris
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PROTECTED SENSOR FIELD EFFECT TRANSISTORS
Publication number
20160370314
Publication date
Dec 22, 2016
FREESCALE SEMICONDUCTOR, INC.
Patrice M. Parris
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CIRCUIT DEVICES WITH COUNTER-DOPED CONDUCTIVE GATES
Publication number
20160365422
Publication date
Dec 15, 2016
FREESCALE SEMICONDUCTOR, INC.
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PROTECTED SENSOR FIELD EFFECT TRANSISTORS
Publication number
20160356740
Publication date
Dec 8, 2016
FREESCALE SEMICONDUCTOR, INC.
Patrice M. Parris
G01 - MEASURING TESTING
Information
Patent Application
STACKED PROTECTION DEVICES WITH OVERSHOOT PROTECTION AND RELATED FA...
Publication number
20160268245
Publication date
Sep 15, 2016
WEIZE CHEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE AND RELATED FABRICATION METHODS
Publication number
20160172489
Publication date
Jun 16, 2016
WEIZE CHEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE AND RELATED PROTECTION METHODS
Publication number
20160172845
Publication date
Jun 16, 2016
PATRICE M. PARRIS
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
SEMICONDUCTOR DEVICE INCLUDING POWER AND LOGIC DEVICES AND RELATED...
Publication number
20160141211
Publication date
May 19, 2016
WEIZE CHEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF MAKING A SPLIT GATE MEMORY CELL
Publication number
20160126327
Publication date
May 5, 2016
FREESCALE SEMICONDUCTOR, INC.
WEIZE CHEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTEGRATED CIRCUIT DEVICES WITH COUNTER-DOPED CONDUCTIVE GATES
Publication number
20160118469
Publication date
Apr 28, 2016
FREESCALE SEMICONDUCTOR, INC.
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTEGRATED BREAKDOWN PROTECTION
Publication number
20160118495
Publication date
Apr 28, 2016
FREESCALE SEMICONDUCTOR, INC.
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE WITH NON-ISOLATED POWER TRANSISTOR WITH INTEGR...
Publication number
20160099349
Publication date
Apr 7, 2016
FREESCALE SEMICONDUCTOR, INC.
Patrice M. Parris
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTEGRATED ELECTROSTATIC DISCHARGE (ESD) CLAMPING
Publication number
20160099240
Publication date
Apr 7, 2016
Freescale Seminconductor, Inc.
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE AND DRIVER CIRCUIT WITH AN ACTIVE DEVICE AND I...
Publication number
20160013182
Publication date
Jan 14, 2016
FREESCALE SEMICONDUCTOR, INC.
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE AND DRIVER CIRCUIT WITH DRAIN AND ISOLATION ST...
Publication number
20150380317
Publication date
Dec 31, 2015
FREESCALE SEMICONDUCTOR, INC.
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE AND DRIVER CIRCUIT WITH SOURCE AND ISOLATION S...
Publication number
20150357324
Publication date
Dec 10, 2015
FREESCALE SEMICONDUCTOR, INC.
Weize Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ZENER DIODE DEVICES AND RELATED FABRICATION METHODS
Publication number
20150333189
Publication date
Nov 19, 2015
Freescale Semiconductor Inc.
Weize CHEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Differential Pair Sensing Circuit Structures
Publication number
20150316503
Publication date
Nov 5, 2015
FREESCALE SEMICONDUCTOR, INC.
Md M. Hoque
G01 - MEASURING TESTING
Information
Patent Application
ION SENSITIVE FIELD EFFECT TRANSISTORS WITH PROTECTION DIODES AND M...
Publication number
20150171018
Publication date
Jun 18, 2015
MD M. HOQUE
G01 - MEASURING TESTING