Weizhong Wang

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Exposure correction based on reflective index for photolithographic...
- Patent number 6,482,573
- Issue date Nov 19, 2002
- Advanced Micro Devices, Inc.
- Jayendra D. Bhakta
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
In-situ feedback system for localized CMP thickness control
- Patent number 6,303,507
- Issue date Oct 16, 2001
- Advanced Micro Devices, Inc.
- Weizhong Wang
- B24 - GRINDING POLISHING