Weizong XU

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Nanjing, CN

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Patents Grantslast 30 patents

Information Patent Grant
In-situ testing system for semiconductor device in aerospace irradi...
- Patent number 12,146,908
- Issue date Nov 19, 2024
- Nanjing University
- Feng Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Silicon carbide-based lateral PN junction extreme ultraviolet detec...
- Patent number 12,080,821
- Issue date Sep 3, 2024
- Nanjing University
- Hai Lu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
NOVEL SILICON CARBIDE-BASED LATERAL PN JUNCTION EXTREME ULTRAVIOLET...
- Publication number 20240204126
- Publication date Jun 20, 2024
- Nanjing University
- Hai LU
- H01 - BASIC ELECTRIC ELEMENTS