Wen-Chi Hsu

Person

Lugang Township, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Reliability detection device and reliability detection method
- Patent number 11,451,222
- Issue date Sep 20, 2022
- Realtek Semiconductor Corporation
- Wen-Hsuan Hsu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Measuring circuit for quantizing variations in circuit operating speed
- Patent number 10,763,836
- Issue date Sep 1, 2020
- Realtek Semiconductor Corporation
- Chun-Yi Kuo
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Circuit operating speed detecting circuit
- Patent number 10,686,433
- Issue date Jun 16, 2020
- Realtek Semiconductor Corporation
- Chun-yi Kuo
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrated circuit test method
- Patent number 10,496,505
- Issue date Dec 3, 2019
- Realtek Semiconductor Corporation
- Wen-Hsuan Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for dynamic deployment of pin functions on a chip
- Patent number 7,612,581
- Issue date Nov 3, 2009
- Holtek Semiconductor Inc.
- Wen-Chi Hsu
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
RELIABILITY DETECTION DEVICE AND RELIABILITY DETECTION METHOD
- Publication number 20220247399
- Publication date Aug 4, 2022
- REALTEK SEMICONDUCTOR CORPORATION
- WEN-HSUAN HSU
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Circuit operating speed detecting circuit
- Publication number 20200212900
- Publication date Jul 2, 2020
- REALTEK SEMICONDUCTOR CORPORATION
- CHUN-YI KUO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Measuring circuit for quantizing variations in circuit operating speed
- Publication number 20200212901
- Publication date Jul 2, 2020
- REALTEK SEMICONDUCTOR CORPORATION
- CHUN-YI KUO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INTEGRATED CIRCUIT TEST METHOD
- Publication number 20180181477
- Publication date Jun 28, 2018
- REALTEK SEMICONDUCTOR CORPORATION
- WEN-HSUAN HSU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR DYNAMIC DEPLOYMENT OF PIN FUNCTIONS ON A CHIP
- Publication number 20090045837
- Publication date Feb 19, 2009
- Holtek Semiconductor Inc.
- WEN-CHI HSU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LOW POWER-CONSUMPTION DATA PROCESSOR
- Publication number 20080313421
- Publication date Dec 18, 2008
- Holtek Semiconductor Inc.
- Wen-Chi Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Microcontroller circuit and power saving method thereof
- Publication number 20080307241
- Publication date Dec 11, 2008
- Eric Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of speeding up execution of repeatable commands and microcon...
- Publication number 20080301421
- Publication date Dec 4, 2008
- Wen-Chi Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Control device and control method
- Publication number 20080301498
- Publication date Dec 4, 2008
- Holtek Semiconductor Inc.
- Wen-Chi Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Expandable decoding circuit and decoding method
- Publication number 20080180133
- Publication date Jul 31, 2008
- Wen-Chi Hsu
- G11 - INFORMATION STORAGE
Information Patent Application
POOL COUNTING CIRCUIT OF A MICROCONTROLLER AND THE POOL COUNTING ME...
- Publication number 20080162978
- Publication date Jul 3, 2008
- Holtek Semiconductor Inc.
- WEN-CHI HSU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR RESETTING MICRO CONTROLLER
- Publication number 20080155291
- Publication date Jun 26, 2008
- Holtek Semiconductor Inc.
- Wen-Chi Hsu
- G06 - COMPUTING CALCULATING COUNTING

Wen-Chi Hsu

Person

Patents Grantslast 30 patents

Reliability detection device and reliability detection method

Measuring circuit for quantizing variations in circuit operating speed

Circuit operating speed detecting circuit

Integrated circuit test method

Apparatus for dynamic deployment of pin functions on a chip

Patents Applicationslast 30 patents

RELIABILITY DETECTION DEVICE AND RELIABILITY DETECTION METHOD

Circuit operating speed detecting circuit

Measuring circuit for quantizing variations in circuit operating speed

INTEGRATED CIRCUIT TEST METHOD

APPARATUS FOR DYNAMIC DEPLOYMENT OF PIN FUNCTIONS ON A CHIP

LOW POWER-CONSUMPTION DATA PROCESSOR

Microcontroller circuit and power saving method thereof

Method of speeding up execution of repeatable commands and microcon...

Control device and control method

Expandable decoding circuit and decoding method

POOL COUNTING CIRCUIT OF A MICROCONTROLLER AND THE POOL COUNTING ME...

METHOD FOR RESETTING MICRO CONTROLLER