Wen Chung Hsueh

Person

Hsinchu City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Extreme ultraviolet mask with reduced wafer neighboring effect
- Patent number 12,130,548
- Issue date Oct 29, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wen-Chang Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mask blanks and methods for depositing layers on mask blank
- Patent number 12,019,367
- Issue date Jun 25, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hsin-Chang Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mask for extreme ultraviolet photolithography
- Patent number 11,815,805
- Issue date Nov 14, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wen-Chang Hsueh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of manufacturing extreme ultraviolet mask with reduced wafer...
- Patent number 11,740,547
- Issue date Aug 29, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wen-Chang Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mask blanks and methods for depositing layers on mask blank
- Patent number 11,531,262
- Issue date Dec 20, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hsin-Chang Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mask for extreme ultraviolet photolithography
- Patent number 11,294,271
- Issue date Apr 5, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wen-Chang Hsueh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mask patterns and method of manufacture
- Patent number 11,143,954
- Issue date Oct 12, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wen-Chang Hsueh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Extreme ultraviolet mask with reduced wafer neighboring effect and...
- Patent number 10,996,553
- Issue date May 4, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wen-Chang Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for anaerobic threshold heart rate detection
- Patent number 10,159,444
- Issue date Dec 25, 2018
- Industrial Technology Research Institute
- Hsing-Chen Lin
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for controlling electronic equipment and wearable device
- Patent number 10,120,453
- Issue date Nov 6, 2018
- Industrial Technology Research Institute
- Wen-Chung Hsueh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Double-layered backlight module
- Patent number 9,709,850
- Issue date Jul 18, 2017
- AU OPTRONICS CORPORATION
- Wen-Lin Hsueh
- G02 - OPTICS
Information Patent Grant
Integrated circuit and method for establishing scan test architectu...
- Patent number 9,535,120
- Issue date Jan 3, 2017
- MediaTek Singapore Pte Ltd.
- Jianguo Ren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for inspection of a patterned structure
- Patent number 9,530,200
- Issue date Dec 27, 2016
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wen-Chang Hsueh
- G02 - OPTICS
Information Patent Grant
Structure and method of photomask with reduction of electron-beam s...
- Patent number 9,429,835
- Issue date Aug 30, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wen-Chang Hsueh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Reticle and method of fabricating the same
- Patent number 9,341,940
- Issue date May 17, 2016
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wen-Chang Hsueh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Memory with error correction configured to prevent overcorrection
- Patent number 9,280,412
- Issue date Mar 8, 2016
- Macronix International Co., Ltd.
- Wen-Feng Hsueh
- G11 - INFORMATION STORAGE
Information Patent Grant
Optoelectronic system for sensing an electric field signal
- Patent number 7,583,866
- Issue date Sep 1, 2009
- Industrial Technology Research Institute
- Ming Chieh Huang
- G01 - MEASURING TESTING
Information Patent Grant
Optoelectronic system for sensing an electromagnetic field at total...
- Patent number 7,528,358
- Issue date May 5, 2009
- Industrial Technology Research Institute
- Ming Chieh Huang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CORE TEST METHOD AND CORE TEST CIRCUIT
- Publication number 20240345941
- Publication date Oct 17, 2024
- MEDIATEK SINGAPORE PTE LTD
- Jianguo Ren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EUV PHOTO MASKS AND MANUFACTURING METHOD THEREOF
- Publication number 20240053669
- Publication date Feb 15, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wen-Chang HSUEH
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
EXTREME ULTRAVIOLET MASK WITH REDUCED WAFER NEIGHBORING EFFECT
- Publication number 20230367194
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wen-Chang HSUEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASK BLANKS AND METHODS FOR DEPOSITING LAYERS ON MASK BLANK
- Publication number 20230121303
- Publication date Apr 20, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsin-Chang LEE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MASK FOR EXTREME ULTRAVIOLET PHOTOLITHOGRAPHY
- Publication number 20220221785
- Publication date Jul 14, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wen-Chang HSUEH
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MASK FOR EXTREME ULTRAVIOLET PHOTOLITHOGRAPHY
- Publication number 20210341829
- Publication date Nov 4, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wen-Chang HSUEH
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF MANUFACTURING EXTREME ULTRAVIOLET MASK WITH REDUCED WAFER...
- Publication number 20210247687
- Publication date Aug 12, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wen-Chang HSUEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASK BLANKS AND METHODS FOR DEPOSITING LAYERS ON MASK BLANK
- Publication number 20210200078
- Publication date Jul 1, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hsin-Chang LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mask Patterns and Method of Manufacture
- Publication number 20190391480
- Publication date Dec 26, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wen-Chang Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EXTREME ULTRAVIOLET MASK WITH REDUCED WAFER NEIGHBORING EFFECT AND...
- Publication number 20190146325
- Publication date May 16, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wen-Chang HSUEH
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR CONTROLLING ELECTRONIC EQUIPMENT AND WEARABLE DEVICE
- Publication number 20170228027
- Publication date Aug 10, 2017
- Industrial Technology Research Institute
- Wen-Chung HSUEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR ANAEROBIC THRESHOLD HEART RATE DETECTION
- Publication number 20170172513
- Publication date Jun 22, 2017
- Industrial Technology Research Institute
- Hsing-Chen Lin
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Double-Layered Backlight Module
- Publication number 20160076738
- Publication date Mar 17, 2016
- AU OPTRONICS CORPORATION
- Wen-Lin Hsueh
- F21 - LIGHTING
Information Patent Application
METHOD AND SYSTEM FOR INSPECTION OF A PATTERNED STRUCTURE
- Publication number 20150371377
- Publication date Dec 24, 2015
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wen-Chang HSUEH
- G02 - OPTICS
Information Patent Application
RETICLE AND METHOD OF FABRICATING THE SAME
- Publication number 20150331309
- Publication date Nov 19, 2015
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wen-Chang HSUEH
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
INTEGRATED CIRCUIT AND METHOD FOR ESTABLISHING SCAN TEST ARCHITECTU...
- Publication number 20150276871
- Publication date Oct 1, 2015
- MEDIATEK SINGAPORE PTE LTD
- Jianguo REN
- G01 - MEASURING TESTING
Information Patent Application
Structure and Method of Photomask with Reduction of Electron-Beam S...
- Publication number 20150227037
- Publication date Aug 13, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wen-Chang Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY WITH ERROR CORRECTION CONFIGURED TO PREVENT OVERCORRECTION
- Publication number 20140281803
- Publication date Sep 18, 2014
- Macronix International Co., Ltd.
- WEN-FENG HSUEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Optoelectronic System for Sensing an Electric Field Signal
- Publication number 20070160318
- Publication date Jul 12, 2007
- Industrial Technology Research Institute
- Jui Jung Jao
- G02 - OPTICS
Information Patent Application
Optoelectronic System for Sensing an Electromagnetic Field at Total...
- Publication number 20070153254
- Publication date Jul 5, 2007
- Industrial Technology Research Institute
- Ming Chieh Huang
- G01 - MEASURING TESTING

Wen Chung Hsueh

Person

Patents Grantslast 30 patents

Extreme ultraviolet mask with reduced wafer neighboring effect

Mask blanks and methods for depositing layers on mask blank

Mask for extreme ultraviolet photolithography

Method of manufacturing extreme ultraviolet mask with reduced wafer...

Mask blanks and methods for depositing layers on mask blank

Mask for extreme ultraviolet photolithography

Mask patterns and method of manufacture

Extreme ultraviolet mask with reduced wafer neighboring effect and...

Method and system for anaerobic threshold heart rate detection

Method for controlling electronic equipment and wearable device

Double-layered backlight module

Integrated circuit and method for establishing scan test architectu...

Method and system for inspection of a patterned structure

Structure and method of photomask with reduction of electron-beam s...

Reticle and method of fabricating the same

Memory with error correction configured to prevent overcorrection

Optoelectronic system for sensing an electric field signal

Optoelectronic system for sensing an electromagnetic field at total...

Patents Applicationslast 30 patents

CORE TEST METHOD AND CORE TEST CIRCUIT

EUV PHOTO MASKS AND MANUFACTURING METHOD THEREOF

EXTREME ULTRAVIOLET MASK WITH REDUCED WAFER NEIGHBORING EFFECT

MASK BLANKS AND METHODS FOR DEPOSITING LAYERS ON MASK BLANK

MASK FOR EXTREME ULTRAVIOLET PHOTOLITHOGRAPHY

MASK FOR EXTREME ULTRAVIOLET PHOTOLITHOGRAPHY

METHOD OF MANUFACTURING EXTREME ULTRAVIOLET MASK WITH REDUCED WAFER...

MASK BLANKS AND METHODS FOR DEPOSITING LAYERS ON MASK BLANK

Mask Patterns and Method of Manufacture

EXTREME ULTRAVIOLET MASK WITH REDUCED WAFER NEIGHBORING EFFECT AND...

METHOD FOR CONTROLLING ELECTRONIC EQUIPMENT AND WEARABLE DEVICE

METHOD AND SYSTEM FOR ANAEROBIC THRESHOLD HEART RATE DETECTION

Double-Layered Backlight Module

METHOD AND SYSTEM FOR INSPECTION OF A PATTERNED STRUCTURE

RETICLE AND METHOD OF FABRICATING THE SAME

INTEGRATED CIRCUIT AND METHOD FOR ESTABLISHING SCAN TEST ARCHITECTU...

Structure and Method of Photomask with Reduction of Electron-Beam S...

MEMORY WITH ERROR CORRECTION CONFIGURED TO PREVENT OVERCORRECTION

Optoelectronic System for Sensing an Electric Field Signal

Optoelectronic System for Sensing an Electromagnetic Field at Total...