Wen-Hwa Luo

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New Taipei City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Testing apparatus and testing method of electronic device
- Patent number 9,285,427
- Issue date Mar 15, 2016
- Wistron Corporation
- Wen-Hwa Luo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING APPARATUS AND TESTING METHOD OF ELECTRONIC DEVICE
- Publication number 20140164858
- Publication date Jun 12, 2014
- Wistron Corporation
- Wen-Hwa Luo
- G01 - MEASURING TESTING
Information Patent Application
Transmission Interface and Method for Determining Transmission Signal
- Publication number 20130265891
- Publication date Oct 10, 2013
- Wen-Hwa Luo
- G06 - COMPUTING CALCULATING COUNTING