Wen Jin

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for preventing the fraudulent sending of data f...
- Patent number 11,882,151
- Issue date Jan 23, 2024
- JPMorgan Chase Bank, N.A.
- Howard Spector
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining confident data samples for machine learning models on u...
- Patent number 11,593,650
- Issue date Feb 28, 2023
- GE PRECISION HEALTHCARE LLC
- Min Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data-driven deep learning model generalization analysis and improve...
- Patent number 11,514,329
- Issue date Nov 29, 2022
- General Electric Company
- Wen Jin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Accurate and fast neural network training for library-based critica...
- Patent number 9,607,265
- Issue date Mar 28, 2017
- KLA-Tencor Corporation
- Wen Jin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Nondestructive inline X-ray metrology with model-based library method
- Patent number 9,490,183
- Issue date Nov 8, 2016
- Tokyo Electron Limited
- Wen Jin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for in-situ film stack measurement during etching and etch c...
- Patent number 9,059,038
- Issue date Jun 16, 2015
- Tokyo Electron Limited
- Shifang Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Accurate and fast neural network training for library-based critica...
- Patent number 8,577,820
- Issue date Nov 5, 2013
- Tokyo Electron Limited
- Wen Jin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determination of training set size for a machine learning system
- Patent number 8,452,718
- Issue date May 28, 2013
- Tokyo Electron Limited
- Wen Jin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wide process range library for metrology
- Patent number 8,381,140
- Issue date Feb 19, 2013
- Tokyo Electron Limited
- John J. Hench
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Approximating eigensolutions for use in determining the profile of...
- Patent number 7,630,873
- Issue date Dec 8, 2009
- Tokyo Electron Limited
- Joerg Bischoff
- G01 - MEASURING TESTING
Information Patent Grant
Controlling a fabrication tool using support vector machine
- Patent number 7,567,352
- Issue date Jul 28, 2009
- Tokyo Electron Limited
- Wen Jin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical metrology using a support vector machine with simulated dif...
- Patent number 7,511,835
- Issue date Mar 31, 2009
- Tokyo Electron Limited
- Wen Jin
- G01 - MEASURING TESTING
Information Patent Grant
Optical metrology using support vector machine with profile paramet...
- Patent number 7,483,809
- Issue date Jan 27, 2009
- Tokyo Electron Limited
- Wen Jin
- G01 - MEASURING TESTING
Information Patent Grant
Optimization of diffraction order selection for two-dimensional str...
- Patent number 7,428,060
- Issue date Sep 23, 2008
- Timbre Technologies, Inc.
- Wen Jin
- G01 - MEASURING TESTING
Information Patent Grant
Selecting a hypothetical profile to use in optical metrology
- Patent number 7,394,554
- Issue date Jul 1, 2008
- Timbre Technologies, Inc.
- Vi Vuong
- G01 - MEASURING TESTING
Information Patent Grant
Controlling a fabrication tool using support vector machine
- Patent number 7,372,583
- Issue date May 13, 2008
- Tokyo Electron Limited
- Wen Jin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Integrated circuit profile value determination
- Patent number 6,842,261
- Issue date Jan 11, 2005
- Timbre Technologies, Inc.
- Junwei Bao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR PREVENTING THE FRAUDULENT SENDING OF DATA F...
- Publication number 20210377302
- Publication date Dec 2, 2021
- JPMorgan Chase Bank, N.A.
- Howard SPECTOR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR CONTACTLESS CARD-BASED CREDENTIALS
- Publication number 20210272097
- Publication date Sep 2, 2021
- JPMorgan Chase Bank, N.A.
- Jin WEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING CONFIDENT DATA SAMPLES FOR MACHINE LEARNING MODELS ON U...
- Publication number 20200349434
- Publication date Nov 5, 2020
- GE Precision Healthcare LLC
- Min Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA-DRIVEN DEEP LEARNING MODEL GENERALIZATION ANALYSIS AND IMPROVE...
- Publication number 20200311557
- Publication date Oct 1, 2020
- GENERAL ELECTRIC COMPANY
- Wen Jin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADVANCED OPTICAL SENSOR, SYSTEM, AND METHODOLOGIES FOR ETCH PROCESS...
- Publication number 20180286643
- Publication date Oct 4, 2018
- TOKYO ELECTRON LIMITED
- Holger TUITJE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NONDESTRUCTIVE INLINE X-RAY METROLOGY WITH MODEL-BASED LIBRARY METHOD
- Publication number 20150330915
- Publication date Nov 19, 2015
- TOKYO ELECTRON LIMITED
- Wen JIN
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE AND FAST NEURAL NETWORK TRAINING FOR LIBRARY-BASED CRITICA...
- Publication number 20140032463
- Publication date Jan 30, 2014
- Wen Jin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM FOR IN-SITU FILM STACK MEASUREMENT DURING ETCHING AND ETCH C...
- Publication number 20140024143
- Publication date Jan 23, 2014
- TOKYO ELECTRON LIMITED
- Shifang LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Accurate and Fast Neural network Training for Library-Based Critica...
- Publication number 20120226644
- Publication date Sep 6, 2012
- Wen Jin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WIDE PROCESS RANGE LIBRARY FOR METROLOGY
- Publication number 20120210289
- Publication date Aug 16, 2012
- John J. Hench
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DETERMINATION OF TRAINING SET SIZE FOR A MACHINE LEARNING SYSTEM
- Publication number 20110307424
- Publication date Dec 15, 2011
- Wen Jin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROLLING A FABRICATION TOOL USING SUPPORT VECTOR MACHINE
- Publication number 20080252908
- Publication date Oct 16, 2008
- TOKYO ELECTRON LIMITED
- Wen JIN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Optical metrology using support vector machine with profile paramet...
- Publication number 20080255786
- Publication date Oct 16, 2008
- TOKYO ELECTRON LIMITED
- Wen Jin
- G01 - MEASURING TESTING
Information Patent Application
Optical metrology using a support vector machine with simulated dif...
- Publication number 20080255801
- Publication date Oct 16, 2008
- TOKYO ELECTRON LIMITED
- Wen Jin
- G01 - MEASURING TESTING
Information Patent Application
Optimization of diffraction order selection for two-dimensional str...
- Publication number 20070223011
- Publication date Sep 27, 2007
- Timbre Technologies, Inc.
- Wen Jin
- G01 - MEASURING TESTING
Information Patent Application
Selecting a hypothetical profile to use in optical metrology
- Publication number 20050057748
- Publication date Mar 17, 2005
- TimbreTechnologies, Inc.
- Vi Vuong
- G01 - MEASURING TESTING
Information Patent Application
Approximating eigensolutions for use in determining the profile of...
- Publication number 20040167754
- Publication date Aug 26, 2004
- Joerg Bischoff
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit profile value determination
- Publication number 20040039473
- Publication date Feb 26, 2004
- Junwei Bao
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Systems and methods for preventing the fraudulent sending of data f...

Determining confident data samples for machine learning models on u...

Data-driven deep learning model generalization analysis and improve...

Accurate and fast neural network training for library-based critica...

Nondestructive inline X-ray metrology with model-based library method

System for in-situ film stack measurement during etching and etch c...

Accurate and fast neural network training for library-based critica...

Determination of training set size for a machine learning system

Wide process range library for metrology

Approximating eigensolutions for use in determining the profile of...

Controlling a fabrication tool using support vector machine

Optical metrology using a support vector machine with simulated dif...

Optical metrology using support vector machine with profile paramet...

Optimization of diffraction order selection for two-dimensional str...

Selecting a hypothetical profile to use in optical metrology

Controlling a fabrication tool using support vector machine

Integrated circuit profile value determination

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR PREVENTING THE FRAUDULENT SENDING OF DATA F...

SYSTEMS AND METHODS FOR CONTACTLESS CARD-BASED CREDENTIALS

DETERMINING CONFIDENT DATA SAMPLES FOR MACHINE LEARNING MODELS ON U...

DATA-DRIVEN DEEP LEARNING MODEL GENERALIZATION ANALYSIS AND IMPROVE...

ADVANCED OPTICAL SENSOR, SYSTEM, AND METHODOLOGIES FOR ETCH PROCESS...

NONDESTRUCTIVE INLINE X-RAY METROLOGY WITH MODEL-BASED LIBRARY METHOD

ACCURATE AND FAST NEURAL NETWORK TRAINING FOR LIBRARY-BASED CRITICA...

SYSTEM FOR IN-SITU FILM STACK MEASUREMENT DURING ETCHING AND ETCH C...

Accurate and Fast Neural network Training for Library-Based Critica...

WIDE PROCESS RANGE LIBRARY FOR METROLOGY

DETERMINATION OF TRAINING SET SIZE FOR A MACHINE LEARNING SYSTEM

CONTROLLING A FABRICATION TOOL USING SUPPORT VECTOR MACHINE

Optical metrology using support vector machine with profile paramet...

Optical metrology using a support vector machine with simulated dif...

Optimization of diffraction order selection for two-dimensional str...

Selecting a hypothetical profile to use in optical metrology

Approximating eigensolutions for use in determining the profile of...

Integrated circuit profile value determination