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Wen Jun WENG
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Shanghai, CN
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Patents Grants
last 30 patents
Information
Patent Grant
Circuit and method for measuring working current of circuit module
Patent number
10,983,160
Issue date
Apr 20, 2021
Semiconductor Manufacturing International (Shanghai) Corporation
Chia Chi Yang
G01 - MEASURING TESTING
Information
Patent Grant
Power supply circuit and a method of controlling the same
Patent number
10,386,881
Issue date
Aug 20, 2019
Semiconductor Manufacturing International (Shanghai) Corporation
Chia Chi Yang
G05 - CONTROLLING REGULATING
Patents Applications
last 30 patents
Information
Patent Application
POWER SUPPLY CIRCUIT AND A METHOD OF CONTROLLING THE SAME
Publication number
20190004557
Publication date
Jan 3, 2019
Semiconductor Manufacturing International (Shanghai) Corporation
Chia Chi YANG
G05 - CONTROLLING REGULATING
Information
Patent Application
CIRCUIT AND METHOD FOR MEASURING WORKING CURRENT OF CIRCUIT MODULE
Publication number
20180356461
Publication date
Dec 13, 2018
Semiconductor Manufacturing International (Shanghai) Corporation
Chia Chi YANG
G01 - MEASURING TESTING
Information
Patent Application
BANDGAP REFERENCE CIRCUIT AND METHOD OF USING THE SAME
Publication number
20180129237
Publication date
May 10, 2018
Semiconductor Manufacturing International (Shanghai) Corporation
Josh YANG
H03 - BASIC ELECTRONIC CIRCUITRY