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SEMICONDUCTOR CELL STRUCTURE
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Publication number 20250203838
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Publication date Jun 19, 2025
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Invention And Collaboration Laboratory, Inc.
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Chao-Chun LU
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G11 - INFORMATION STORAGE
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SACRIFICIAL TEST PAD
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Publication number 20250132208
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Publication date Apr 24, 2025
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Taiwan Semiconductor Manufacturing Company, Ltd.
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Tzu-Ting Liu
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H01 - BASIC ELECTRIC ELEMENTS
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SEMICONDUCTOR DEVICE
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Publication number 20240387617
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Publication date Nov 21, 2024
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Taiwan Semiconductor Manufacturing Company, Ltd.
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Tsung-Chieh HSIAO
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H01 - BASIC ELECTRIC ELEMENTS
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INTEGRATED CIRCUIT DEVICE
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Publication number 20240096710
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Publication date Mar 21, 2024
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Taiwan Semiconductor Manufacturing Company, Ltd.
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Wen-Hsien TU
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H01 - BASIC ELECTRIC ELEMENTS
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HIGH VOLTAGE PASSIVE DEVICE STRUCTURE
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Publication number 20230317593
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Publication date Oct 5, 2023
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Taiwan Semiconductor Manufacturing Company, Ltd.
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Yuan-Yang Hsiao
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H01 - BASIC ELECTRIC ELEMENTS
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SOURCE AND DRAIN EPITAXIAL LAYERS
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Publication number 20230074496
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Publication date Mar 9, 2023
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Taiwan Semiconductor Manufacturing Co., Ltd.
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Wen-Hsien TU
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H01 - BASIC ELECTRIC ELEMENTS
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Structure and Method for MRAM Devices
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Publication number 20230062842
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Publication date Mar 2, 2023
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Taiwan Semiconductor Manufacturing Company, Ltd.
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Chih-Fan Huang
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H01 - BASIC ELECTRIC ELEMENTS
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METHOD FOR PROBE PIN RETRIEVAL
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Publication number 20230034452
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Publication date Feb 2, 2023
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Taiwan Semiconductor Manufacturing company Ltd.
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MING-CHENG HSU
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G01 - MEASURING TESTING
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SOURCE AND DRAIN EPITAXIAL LAYERS
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Publication number 20220376067
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Publication date Nov 24, 2022
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Taiwan Semiconductor Manufacturing Co., Ltd.
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Wen-Hsien TU
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H01 - BASIC ELECTRIC ELEMENTS
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