WEN-TING TAI

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FREMONT, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and machine for examining wafers
- Patent number 10,840,156
- Issue date Nov 17, 2020
- ASML Netherlands B.V.
- Chien-Hung Chou
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and machine for examining wafers
- Patent number 9,768,082
- Issue date Sep 19, 2017
- Hermes Microvision Inc.
- Chien-Hung Chou
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR DISTRIBUTED IMAGE RECORDING AND STORAGE FOR C...
- Publication number 20240205347
- Publication date Jun 20, 2024
- ASML NETHERLANDS B.V.
- Myunghoon YOON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND MACHINE FOR EXAMINING WAFERS
- Publication number 20210193537
- Publication date Jun 24, 2021
- ASML NETHERLANDS B.V.
- Chien-Hung CHOU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND MACHINE FOR EXAMINING WAFERS
- Publication number 20180076099
- Publication date Mar 15, 2018
- HERMES MICROVISION, INC.
- CHIEN-HUNG CHOU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND MACHINE FOR EXAMINING WAFERS
- Publication number 20120314054
- Publication date Dec 13, 2012
- HERMES MICROVISION, INC.
- CHIEN-HUNG CHOU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND MACHINE FOR EXAMINING WAFERS
- Publication number 20100211202
- Publication date Aug 19, 2010
- Hermes-Microvision, Inc.
- CHIEN-HUNG CHOU
- G05 - CONTROLLING REGULATING