Wen-Zhan Zhou

Person

Singapore, SG

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for inspection of wet ophthalmic lens
- Patent number 10,949,963
- Issue date Mar 16, 2021
- EMAGE VISION PTE. LTD.
- Soon Wei Wong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for inspection of wet ophthalmic lens
- Patent number 10,489,901
- Issue date Nov 26, 2019
- EMAGE VISION PTE. LTD.
- Soon Wei Wong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Litho scanner alignment signal improvement
- Patent number 9,034,720
- Issue date May 19, 2015
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Hui Liu
- G02 - OPTICS
Information Patent Grant
Reliable interconnect for semiconductor device
- Patent number 8,987,134
- Issue date Mar 24, 2015
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Zhehui Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spacer profile engineering using films with continuously increased...
- Patent number 8,828,858
- Issue date Sep 9, 2014
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Xuesong Rao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Step-like spacer profile
- Patent number 8,492,236
- Issue date Jul 23, 2013
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Xuesong Rao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-variable regression for metrology
- Patent number 7,966,142
- Issue date Jun 21, 2011
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Wen Zhan Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting semiconductor manufacturing conditions
- Patent number 7,553,678
- Issue date Jun 30, 2009
- United Microelectronics Corp.
- Wen-Zhan Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reticle and optical proximity correction method
- Patent number 7,527,900
- Issue date May 5, 2009
- United Microelectronics Corp.
- Wen-Zhan Zhou
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for eliminating bridging defect in via first dual damascene...
- Patent number 7,238,619
- Issue date Jul 3, 2007
- United Microelectronics Corp.
- Wen-Zhan Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-line focus monitor structure and method using top-down SEM
- Patent number 6,777,145
- Issue date Aug 17, 2004
- Chartered Semiconductor Manufacturing Ltd.
- Wen-Zhan Zhou
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR INSPECTION OF WET OPHTHALMIC LENS
- Publication number 20200074620
- Publication date Mar 5, 2020
- EMAGE VISION PTE. LTD.
- Soon Wei WONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTION OF WET OPHTHALMIC LENS
- Publication number 20170011507
- Publication date Jan 12, 2017
- EMAGE VISION PTE. LTD.
- Soon Wei WONG
- G02 - OPTICS
Information Patent Application
LITHO SCANNER ALIGNMENT SIGNAL IMPROVEMENT
- Publication number 20140050439
- Publication date Feb 20, 2014
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Hui LIU
- G02 - OPTICS
Information Patent Application
RELIABLE INTERCONNECT FOR SEMICONDUCTOR DEVICE
- Publication number 20130328201
- Publication date Dec 12, 2013
- Zhehui WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPACER PROFILE ENGINEERING USING FILMS WITH CONTINUOUSLY INCREASED...
- Publication number 20130187202
- Publication date Jul 25, 2013
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Xuesong Rao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STEP-LIKE SPACER PROFILE
- Publication number 20130181259
- Publication date Jul 18, 2013
- Global Foundries Singapore PTE. Ltd.
- Xuesong Rao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-VARIABLE REGRESSION FOR METROLOGY
- Publication number 20090258445
- Publication date Oct 15, 2009
- CHARTERED SEMICONDUCTOR MANUFACTURING, LTD.
- Wen Zhan ZHOU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING SEMICONDUCTOR MANUFACTURING CONDITIONS
- Publication number 20070220458
- Publication date Sep 20, 2007
- Wen-Zhan Zhou
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MULTI-ZONE CARRIER HEAD FOR CHEMICAL MECHANICAL POLISHING AND CMP M...
- Publication number 20070167110
- Publication date Jul 19, 2007
- Yu-Hsiang Tseng
- B24 - GRINDING POLISHING
Information Patent Application
RETICLE AND OPTICAL PROXIMITY CORRECTION METHOD
- Publication number 20070105023
- Publication date May 10, 2007
- Wen-Zhan Zhou
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR ELIMINATING BRIDGING DEFECT IN VIA FIRST DUAL DAMASCENE...
- Publication number 20070010092
- Publication date Jan 11, 2007
- Wen-Zhan Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
In-line focus monitor structure and method using top-down SEM
- Publication number 20030224252
- Publication date Dec 4, 2003
- Chartered Semiconductor Manufacturing Ltd.
- Wen-Zhan Zhou
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Wen-Zhan Zhou

Person

Patents Grantslast 30 patents

System and method for inspection of wet ophthalmic lens

System and method for inspection of wet ophthalmic lens

Litho scanner alignment signal improvement

Reliable interconnect for semiconductor device

Spacer profile engineering using films with continuously increased...

Step-like spacer profile

Multi-variable regression for metrology

Method for detecting semiconductor manufacturing conditions

Reticle and optical proximity correction method

Method for eliminating bridging defect in via first dual damascene...

In-line focus monitor structure and method using top-down SEM

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR INSPECTION OF WET OPHTHALMIC LENS

SYSTEM AND METHOD FOR INSPECTION OF WET OPHTHALMIC LENS

LITHO SCANNER ALIGNMENT SIGNAL IMPROVEMENT

RELIABLE INTERCONNECT FOR SEMICONDUCTOR DEVICE

SPACER PROFILE ENGINEERING USING FILMS WITH CONTINUOUSLY INCREASED...

STEP-LIKE SPACER PROFILE

MULTI-VARIABLE REGRESSION FOR METROLOGY

METHOD FOR DETECTING SEMICONDUCTOR MANUFACTURING CONDITIONS

MULTI-ZONE CARRIER HEAD FOR CHEMICAL MECHANICAL POLISHING AND CMP M...

RETICLE AND OPTICAL PROXIMITY CORRECTION METHOD

METHOD FOR ELIMINATING BRIDGING DEFECT IN VIA FIRST DUAL DAMASCENE...

In-line focus monitor structure and method using top-down SEM