Yorktown, VA, US
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Patent Grant
UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
David G. MacDonnell
G01 - MEASURING TESTING
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Patent Grant
United States of America as Represented by the Adminstrator of NASA
Wenbo Sun
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the Secretary of the Army
Wenbo Sun
G01 - MEASURING TESTING
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Patent Application
U.S.A. AS REPRESENTED BY THE ADMINSTRATOR OF NASA
David G. MacDonnell
G01 - MEASURING TESTING
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Patent Application
U.S.A. as represented by the Administrator of the Natioanl Aeronautics and Sp...
Wenbo Sun
G01 - MEASURING TESTING
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Patent Application
U.S. ARMY RESEARCH LABORATORY ATTN: RDRL-LOC-I
Wenbo Sun
G01 - MEASURING TESTING
