WENDIE PATRICIA HAYLER

Follow

Person

ATLANTA, GA, US

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray scanning system and method
- Patent number 10,571,597
- Issue date Feb 25, 2020
- United Parcel Service of America, Inc.
- Wendie Patricia Hayler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray scanning system and method
- Patent number 10,203,426
- Issue date Feb 12, 2019
- United Parcel Service of America, Inc.
- Wendie Patricia Hayler
- G01 - MEASURING TESTING
Information Patent Grant
X-ray scanning system and method
- Patent number 10,012,755
- Issue date Jul 3, 2018
- United Parcel Service of America, Inc.
- Wendie Patricia Hayler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray scanning system and method
- Patent number 9,804,289
- Issue date Oct 31, 2017
- United Parcel Service of America, Inc.
- Wendie Patricia Hayler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray scanning system and method
- Patent number 9,541,667
- Issue date Jan 10, 2017
- United Parcel Service of America, Inc.
- Wendie Patricia Hayler
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY SCANNING SYSTEM AND METHOD
- Publication number 20190146116
- Publication date May 16, 2019
- United Parcel Service of America, Inc.
- WENDIE PATRICIA HAYLER
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY SCANNING SYSTEM AND METHOD
- Publication number 20180306943
- Publication date Oct 25, 2018
- United Parcel Service of America, Inc.
- WENDIE PATRICIA HAYLER
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SCANNING SYSTEM AND METHOD
- Publication number 20180024267
- Publication date Jan 25, 2018
- United Parcel Service of America, Inc.
- WENDIE PATRICIA HAYLER
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SCANNING SYSTEM AND METHOD
- Publication number 20170075025
- Publication date Mar 16, 2017
- United Parcel Service of America, Inc.
- WENDIE PATRICIA HAYLER
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SCANNING SYSTEM AND METHOD
- Publication number 20160356914
- Publication date Dec 8, 2016
- United Parcel Service of America, Inc.
- WENDIE PATRICIA HAYLER
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SCANNING SYSTEM AND METHOD
- Publication number 20150063539
- Publication date Mar 5, 2015
- United Parcel Service of America, Inc.
- WENDIE PATRICIA HAYLER
- G01 - MEASURING TESTING