Wenfei Gu

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Defect detection for multi-die masks
- Patent number 11,727,556
- Issue date Aug 15, 2023
- KLA Corp.
- Wenfei Gu
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT DETECTION FOR MULTI-DIE MASKS
- Publication number 20230098730
- Publication date Mar 30, 2023
- KLA Corporation
- Wenfei Gu
- G06 - COMPUTING CALCULATING COUNTING