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Weng Yee Kwong
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Singapore, SG
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last 30 patents
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Patent Grant
TEM sample preparation from a circuit layer structure
Patent number
7,317,188
Issue date
Jan 8, 2008
Systems on Silicon Manufacturing Company Pte. Ltd.
Wen Yi Zhang
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
TEM sample preparation from a circuit layer structure
Publication number
20060243919
Publication date
Nov 2, 2006
SYSTEMS ON SILICON MANUFACTURING COMPANY PTE. LTD.
Wen Yi Zhang
G01 - MEASURING TESTING