Wenhai Han

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Tempe, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Magnetic modulation of force sensor for AC detection in an atomic f...
- Patent number 6,134,955
- Issue date Oct 24, 2000
- Molecular Imaging Corporation
- Wenhai Han
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Microscope for compliance measurement
- Patent number 5,983,712
- Issue date Nov 16, 1999
- Molecular Imaging Corporation
- Stuart M. Lindsay
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilevers for a magnetically driven atomic force microscope
- Patent number 5,866,805
- Issue date Feb 2, 1999
- Molecular Imaging Corporation Arizona Board of Regents
- Wenhai Han
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetically-oscillated probe microscope for operation in liquids
- Patent number 5,753,814
- Issue date May 19, 1998
- Molecular Imaging Corporation
- Wenhai Han
- B82 - NANO-TECHNOLOGY