Wenjian Cai

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Interleaved acousto-optical device scanning for suppression of opti...
- Patent number 10,060,884
- Issue date Aug 28, 2018
- KLA-Tencor Corporation
- Jamie Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Multi-spot scanning collection optics
- Patent number 9,970,883
- Issue date May 15, 2018
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Grant
Systems and methods for run-time alignment of a spot scanning wafer...
- Patent number 9,864,173
- Issue date Jan 9, 2018
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Grant
System and method for apodization in a semiconductor device inspect...
- Patent number 9,645,093
- Issue date May 9, 2017
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Grant
Multi-spot scanning collection optics
- Patent number 9,546,962
- Issue date Jan 17, 2017
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Grant
Interleaved acousto-optical device scanning for suppression of opti...
- Patent number 9,395,340
- Issue date Jul 19, 2016
- KLA-Tencor Corporation
- Jamie Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Image synchronization of scanning wafer inspection system
- Patent number 9,208,553
- Issue date Dec 8, 2015
- KLA-Tencor Corporation
- Kai Cao
- G01 - MEASURING TESTING
Information Patent Grant
System and method for apodization in a semiconductor device inspect...
- Patent number 9,176,069
- Issue date Nov 3, 2015
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Image synchronization of scanning wafer inspection system
- Patent number 8,995,746
- Issue date Mar 31, 2015
- KLA-Tencor Corporation
- Kai Cao
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MULTI-SPOT SCANNING COLLECTION OPTICS
- Publication number 20170115232
- Publication date Apr 27, 2017
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Application
Systems and Methods for Run-Time Alignment of a Spot Scanning Wafer...
- Publication number 20160313256
- Publication date Oct 27, 2016
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Application
Interleaved Acousto-Optical Device Scanning For Suppression Of Opti...
- Publication number 20160290971
- Publication date Oct 6, 2016
- KLA-Tencor Corporation
- Jamie Sullivan
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Apodization in a Semiconductor Device Inspect...
- Publication number 20160054232
- Publication date Feb 25, 2016
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G01 - MEASURING TESTING
Information Patent Application
MULTI-SPOT SCANNING COLLECTION OPTICS
- Publication number 20150226677
- Publication date Aug 13, 2015
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Application
IMAGE SYNCHRONIZATION OF SCANNING WAFER INSPECTION SYSTEM
- Publication number 20150170357
- Publication date Jun 18, 2015
- KLA-Tencor Corporation
- Kai Cao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE SYNCHRONIZATION OF SCANNING WAFER INSPECTION SYSTEM
- Publication number 20140270471
- Publication date Sep 18, 2014
- KLA-Tencor Corporation
- Kai Cao
- G01 - MEASURING TESTING
Information Patent Application
Interleaved Acousto-Optical Device Scanning For Suppression Of Opti...
- Publication number 20140260640
- Publication date Sep 18, 2014
- KLA-Tencor Corporation Drive
- Jamie Sullivan
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Apodization in a Semiconductor Device Inspect...
- Publication number 20140016125
- Publication date Jan 16, 2014
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS

Wenjian Cai

Person

Patents Grantslast 30 patents

Interleaved acousto-optical device scanning for suppression of opti...

Multi-spot scanning collection optics

Systems and methods for run-time alignment of a spot scanning wafer...

System and method for apodization in a semiconductor device inspect...

Multi-spot scanning collection optics

Interleaved acousto-optical device scanning for suppression of opti...

Image synchronization of scanning wafer inspection system

System and method for apodization in a semiconductor device inspect...

Image synchronization of scanning wafer inspection system

Patents Applicationslast 30 patents

MULTI-SPOT SCANNING COLLECTION OPTICS

Systems and Methods for Run-Time Alignment of a Spot Scanning Wafer...

Interleaved Acousto-Optical Device Scanning For Suppression Of Opti...

System and Method for Apodization in a Semiconductor Device Inspect...

MULTI-SPOT SCANNING COLLECTION OPTICS

IMAGE SYNCHRONIZATION OF SCANNING WAFER INSPECTION SYSTEM

IMAGE SYNCHRONIZATION OF SCANNING WAFER INSPECTION SYSTEM

Interleaved Acousto-Optical Device Scanning For Suppression Of Opti...

System and Method for Apodization in a Semiconductor Device Inspect...