Wenjian Sun

Person

Shanghai, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Ion mobility analysis apparatus
- Patent number 12,111,286
- Issue date Oct 8, 2024
- Shimadzu Corporation
- Xiaoqiang Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dielectric barrier discharge ionization, analytical instrument and...
- Patent number 12,106,954
- Issue date Oct 1, 2024
- Shimadzu Corporation
- Yiming Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry analysis method and mass spectrometry system
- Patent number 12,027,358
- Issue date Jul 2, 2024
- Shimadzu Corporation
- Wenjian Sun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization device, mass spectrometer, ion mobility spectrometer, an...
- Patent number 11,735,407
- Issue date Aug 22, 2023
- Shimadzu Research Laboratory (Shanghai) Co. Ltd.
- Yupeng Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer, mass spectrometry method and detection system
- Patent number 11,694,887
- Issue date Jul 4, 2023
- Shimadzu Corporation
- Yiming Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 11,651,947
- Issue date May 16, 2023
- Shimadzu Corporation
- Yiming Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guide device and ion guide method
- Patent number 11,508,565
- Issue date Nov 22, 2022
- Shimadzu Corporation
- Keke Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrum data acquisition and analysis method
- Patent number 11,378,560
- Issue date Jul 5, 2022
- Shimadzu Corporation
- Yunqing Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry analysis method and mass spectrometry system
- Patent number 11,289,318
- Issue date Mar 29, 2022
- Shimadzu Corporation
- Xinfeng Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Ion migration rate analysis device and analysis method applied
- Patent number 11,164,735
- Issue date Nov 2, 2021
- SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO., LTD.
- Kent James Gillig
- G01 - MEASURING TESTING
Information Patent Grant
Ion guiding device and related method
- Patent number 11,127,578
- Issue date Sep 21, 2021
- Shimadzu Corporation
- Yupeng Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample desorption ionization device and analysis method for a mass...
- Patent number 11,031,229
- Issue date Jun 8, 2021
- SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO., LTD.
- Yunqing Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guiding device and guiding method
- Patent number 11,031,224
- Issue date Jun 8, 2021
- Shimadzu Corporation
- Keke Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry data acquisition method
- Patent number 11,031,216
- Issue date Jun 8, 2021
- Shimadzu Corporation
- Yunqing Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data acquisition method in a mass spectrometer
- Patent number 11,031,218
- Issue date Jun 8, 2021
- Shimadzu Corporation
- Xiaoqiang Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Signal processing method and system based on time-of-flight mass sp...
- Patent number 10,825,670
- Issue date Nov 3, 2020
- Shimadzu Corporation
- Jiaqi Shen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quadrupole mass analyzer and method of mass analysis
- Patent number 10,825,676
- Issue date Nov 3, 2020
- Shimadzu Corporation
- Gongyu Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion optical device with orthogonal ion barriers
- Patent number 10,763,098
- Issue date Sep 1, 2020
- Shimadzu Corporation
- Gongyu Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mobility analyzer and analysis method
- Patent number 10,739,308
- Issue date Aug 11, 2020
- SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO., LTD.
- Kent James Gillig
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer, ion optical device, and method for ion manipulat...
- Patent number 10,741,379
- Issue date Aug 11, 2020
- Shimadzu Corporation
- Xiaoqiang Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Proton transfer reaction mass spectrometer
- Patent number 10,636,641
- Issue date Apr 28, 2020
- Shimadzu Corporation
- Xiaoqiang Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guiding device
- Patent number 10,515,790
- Issue date Dec 24, 2019
- Shimadzu Corporation
- Yupeng Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mobility spectrometry apparatus and method
- Patent number 10,386,334
- Issue date Aug 20, 2019
- Shimadzu Corporation
- Xiaoqiang Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer and method applied thereby for reducing ion loss...
- Patent number 10,192,728
- Issue date Jan 29, 2019
- Shimadzu Corporation
- Xiaoqiang Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focusing ion guiding apparatus and mass spectrographic analysis app...
- Patent number 10,020,179
- Issue date Jul 10, 2018
- Shimadzu Corporation
- Gongyu Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and devices for parallel analysis of ion mobility spectrum...
- Patent number 10,020,174
- Issue date Jul 10, 2018
- Shimadzu Corporation
- Xiaoqiang Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion optical apparatus and mass spectrometer
- Patent number 10,014,167
- Issue date Jul 3, 2018
- SHIMADZU CORPORATION
- Xiaoqiang Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guiding device and ion guiding method
- Patent number 10,014,168
- Issue date Jul 3, 2018
- SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO., LTD.
- Xiaoqiang Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guide device and ion guide method
- Patent number 9,620,347
- Issue date Apr 11, 2017
- Shimadzu Corporation
- Xiaoqiang Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion generation device and ion generation method
- Patent number 9,570,281
- Issue date Feb 14, 2017
- Shimadzu Corporation
- Xiaoqiang Zhang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TLC EXTRACTION DEVICE, COMBINED SYSTEM AND EXTRACTION METHOD
- Publication number 20240351022
- Publication date Oct 24, 2024
- Shimadzu Corporation
- Yiming WANG
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
ION SOURCE APPARATUS AND MASS SPECTROMETER
- Publication number 20240213011
- Publication date Jun 27, 2024
- Shimadzu Corporation
- Xiaoqiang ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION GENERATOR, MASS SPECTROMETER AND METHOD OF GENERATING IONS
- Publication number 20240213012
- Publication date Jun 27, 2024
- Shimadzu Corporation
- Wenjian SUN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MOBILITY ANALYSIS APPARATUS
- Publication number 20230417704
- Publication date Dec 28, 2023
- Shimadzu Corporation
- Xiaoqiang ZHANG
- G01 - MEASURING TESTING
Information Patent Application
ION SOURCE AND MASS SPECTROMETER
- Publication number 20230307222
- Publication date Sep 28, 2023
- Shimadzu Corporation
- Saifei CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MOBILITY SPECTROMETRY-MASS SPECTROMETRY COMBINED ANALYSIS DEVICE
- Publication number 20230046612
- Publication date Feb 16, 2023
- Shimadzu Corporation
- Wenjian SUN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MOBILITY ANALYSIS APPARATUS
- Publication number 20220341874
- Publication date Oct 27, 2022
- Shimadzu Corporation
- Xiaoqiang Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION GUIDE DEVICE AND ION GUIDE METHOD
- Publication number 20220102128
- Publication date Mar 31, 2022
- Shimadzu Corporation
- Keke WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20210407786
- Publication date Dec 30, 2021
- Shimadzu Corporation
- Yiming WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER, MASS SPECTROMETRY METHOD AND DETECTION SYSTEM
- Publication number 20210366700
- Publication date Nov 25, 2021
- Shimadzu Corporation
- Yiming LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIELECTRIC BARRIER DISCHARGE IONIZATION, ANALYTICAL INSTRUMENT AND...
- Publication number 20210351027
- Publication date Nov 11, 2021
- SHIMADZU CORPORATION
- Yiming LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY ANALYSIS METHOD AND MASS SPECTROMETRY SYSTEM
- Publication number 20210313158
- Publication date Oct 7, 2021
- Shimadzu Corporation
- Xinfeng ZHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY ANALYSIS METHOD AND MASS SPECTROMETRY SYSTEM
- Publication number 20210313161
- Publication date Oct 7, 2021
- Shimadzu Corporation
- Wenjian SUN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION DEVICE, MASS SPECTROMETER, ION MOBILITY SPECTROMETER, AN...
- Publication number 20210151305
- Publication date May 20, 2021
- SHIMADZU RESEARCH LABORATORY(SHANGHAI) CO. LTD.
- Yupeng CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION GUIDING DEVICE AND RELATED METHOD
- Publication number 20210134575
- Publication date May 6, 2021
- Shimadzu Corporation
- Yupeng CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION GUIDE DEVICE WITH DC FIELD AND ASSOCIATED METHODS
- Publication number 20210134583
- Publication date May 6, 2021
- Shimadzu Corporation
- Yupeng CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTRUM DATA ACQUISITION AND ANALYSIS METHOD
- Publication number 20200278330
- Publication date Sep 3, 2020
- Shimadzu Corporation
- Yunqing HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE FOR GENERATING IONS AND CALIBRATING METHODS OF MASS SPEC...
- Publication number 20200273685
- Publication date Aug 27, 2020
- Shimadzu Corporation
- Liang WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DATA ACQUISITION METHOD IN A MASS SPECTROMETER
- Publication number 20200266041
- Publication date Aug 20, 2020
- Shimadzu Corporation
- Xiaoqiang ZHANG
- G01 - MEASURING TESTING
Information Patent Application
A SAMPLE DESORPTION IONIZATION DEVICE AND ANALYSIS METHOD FOR A MAS...
- Publication number 20200243319
- Publication date Jul 30, 2020
- SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO., LTD.
- Yunqing HUANG
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETRY DATA ACQUISITION METHOD
- Publication number 20200135440
- Publication date Apr 30, 2020
- Shimadzu Corporation
- Yunqing HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION GUIDING DEVICE AND GUIDING METHOD
- Publication number 20200126777
- Publication date Apr 23, 2020
- Shimadzu Corporation
- Keke WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
QUADRUPOLE MASS ANALYZER AND METHOD OF MASS ANALYSIS
- Publication number 20200027714
- Publication date Jan 23, 2020
- Shimadzu Corporation
- Gongyu JIANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIGNAL PROCESSING METHOD AND SYSTEM BASED ON TIME-OF-FLIGHT MASS SP...
- Publication number 20190172694
- Publication date Jun 6, 2019
- Jiaqi SHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MIGRATION RATE ANALYSIS DEVICE AND ANALYSIS METHOD APPLIED
- Publication number 20190164737
- Publication date May 30, 2019
- SHIMADZU RESEARCH LABORATORY(SHANGHAI) CO., LTD.
- Kent James GILLIG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MOBILITY ANALYZER AND ANALYSIS METHOD
- Publication number 20190162698
- Publication date May 30, 2019
- SHIMADZU RESEARCH LABORATORY(SHANGHAI) CO., LTD.
- Kent James GILLIG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION OPTICAL DEVICE
- Publication number 20190080895
- Publication date Mar 14, 2019
- Shimadzu Corporation
- Gongyu Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER, ION OPTICAL DEVICE, AND METHOD FOR ION MANIPULAT...
- Publication number 20190080896
- Publication date Mar 14, 2019
- Shimadzu Corporation
- Xiaoqiang Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MOBILITY SPECTROMETRY APPARATUS AND METHOD
- Publication number 20190056351
- Publication date Feb 21, 2019
- SHIMADZU CORPORATION
- Xiaoqiang Zhang
- G01 - MEASURING TESTING
Information Patent Application
PROTON TRANSFER REACTION MASS SPECTROMETER
- Publication number 20190013191
- Publication date Jan 10, 2019
- Shimadzu Corporation
- Xiaoqiang Zhang
- H01 - BASIC ELECTRIC ELEMENTS

Wenjian Sun

Person

Patents Grantslast 30 patents

Ion mobility analysis apparatus

Dielectric barrier discharge ionization, analytical instrument and...

Mass spectrometry analysis method and mass spectrometry system

Ionization device, mass spectrometer, ion mobility spectrometer, an...

Mass spectrometer, mass spectrometry method and detection system

Mass spectrometer

Ion guide device and ion guide method

Mass spectrum data acquisition and analysis method

Mass spectrometry analysis method and mass spectrometry system

Ion migration rate analysis device and analysis method applied

Ion guiding device and related method

Sample desorption ionization device and analysis method for a mass...

Ion guiding device and guiding method

Mass spectrometry data acquisition method

Data acquisition method in a mass spectrometer

Signal processing method and system based on time-of-flight mass sp...

Quadrupole mass analyzer and method of mass analysis

Ion optical device with orthogonal ion barriers

Ion mobility analyzer and analysis method

Mass spectrometer, ion optical device, and method for ion manipulat...

Proton transfer reaction mass spectrometer

Ion guiding device

Ion mobility spectrometry apparatus and method

Mass spectrometer and method applied thereby for reducing ion loss...

Focusing ion guiding apparatus and mass spectrographic analysis app...

Methods and devices for parallel analysis of ion mobility spectrum...

Ion optical apparatus and mass spectrometer

Ion guiding device and ion guiding method

Ion guide device and ion guide method

Ion generation device and ion generation method

Patents Applicationslast 30 patents

TLC EXTRACTION DEVICE, COMBINED SYSTEM AND EXTRACTION METHOD

ION SOURCE APPARATUS AND MASS SPECTROMETER

ION GENERATOR, MASS SPECTROMETER AND METHOD OF GENERATING IONS

ION MOBILITY ANALYSIS APPARATUS

ION SOURCE AND MASS SPECTROMETER

ION MOBILITY SPECTROMETRY-MASS SPECTROMETRY COMBINED ANALYSIS DEVICE

ION MOBILITY ANALYSIS APPARATUS

ION GUIDE DEVICE AND ION GUIDE METHOD

MASS SPECTROMETER

MASS SPECTROMETER, MASS SPECTROMETRY METHOD AND DETECTION SYSTEM

DIELECTRIC BARRIER DISCHARGE IONIZATION, ANALYTICAL INSTRUMENT AND...

MASS SPECTROMETRY ANALYSIS METHOD AND MASS SPECTROMETRY SYSTEM

MASS SPECTROMETRY ANALYSIS METHOD AND MASS SPECTROMETRY SYSTEM

IONIZATION DEVICE, MASS SPECTROMETER, ION MOBILITY SPECTROMETER, AN...

ION GUIDING DEVICE AND RELATED METHOD

ION GUIDE DEVICE WITH DC FIELD AND ASSOCIATED METHODS

MASS SPECTRUM DATA ACQUISITION AND ANALYSIS METHOD

ION SOURCE FOR GENERATING IONS AND CALIBRATING METHODS OF MASS SPEC...

DATA ACQUISITION METHOD IN A MASS SPECTROMETER

A SAMPLE DESORPTION IONIZATION DEVICE AND ANALYSIS METHOD FOR A MAS...

MASS SPECTROMETRY DATA ACQUISITION METHOD

ION GUIDING DEVICE AND GUIDING METHOD

QUADRUPOLE MASS ANALYZER AND METHOD OF MASS ANALYSIS

SIGNAL PROCESSING METHOD AND SYSTEM BASED ON TIME-OF-FLIGHT MASS SP...

ION MIGRATION RATE ANALYSIS DEVICE AND ANALYSIS METHOD APPLIED

ION MOBILITY ANALYZER AND ANALYSIS METHOD

ION OPTICAL DEVICE

MASS SPECTROMETER, ION OPTICAL DEVICE, AND METHOD FOR ION MANIPULAT...

ION MOBILITY SPECTROMETRY APPARATUS AND METHOD

PROTON TRANSFER REACTION MASS SPECTROMETER