Wenjie LIN

Person

ZHUHAI CITY, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-functional PCB for assembling GaN-based power converter
- Patent number 12,155,313
- Issue date Nov 26, 2024
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Yanbo Zou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High efficiency and high density GaN-based power converter and meth...
- Patent number 11,923,778
- Issue date Mar 5, 2024
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Yanbo Zou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-functional PCB for assembling GaN-based power converter and m...
- Patent number 11,916,005
- Issue date Feb 27, 2024
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Yanbo Zou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High efficiency and high density GaN-based power converter
- Patent number 11,916,489
- Issue date Feb 27, 2024
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Yanbo Zou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-functional PCB for assembling GaN-based power converter
- Patent number 11,916,490
- Issue date Feb 27, 2024
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Yanbo Zou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High efficiency and high density GaN-based power converter
- Patent number 11,916,488
- Issue date Feb 27, 2024
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Yanbo Zou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for measuring high electron mobility transistor
- Patent number 11,747,389
- Issue date Sep 5, 2023
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- Yulin Chen
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for testing semiconductor devices
- Patent number 11,733,287
- Issue date Aug 22, 2023
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- Jihua Li
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for testing semiconductor devices
- Patent number 11,448,685
- Issue date Sep 20, 2022
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- Jihua Li
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
GaN-BASED SWITCHED-MODE POWER SUPPLY WITH PLANAR TRANSFORMER
- Publication number 20240203634
- Publication date Jun 20, 2024
- INNOSCIENCE (SUZHOU) SEMICONDUCTOR CO., LTD.
- Yanbo ZOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GaN-BASED SWITCHED-MODE POWER SUPPLY WITH PLANAR TRANSFORMER
- Publication number 20230246553
- Publication date Aug 3, 2023
- INNOSCIENCE (SUZHOU) SEMICONDUCTOR CO., LTD.
- Yanbo ZOU
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
HIGH EFFICIENCY AND HIGH DENSITY GaN-BASED POWER CONVERTER AND METH...
- Publication number 20230155513
- Publication date May 18, 2023
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Yanbo ZOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20220390502
- Publication date Dec 8, 2022
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- JIHUA LI
- G01 - MEASURING TESTING
Information Patent Application
MULTI-FUNCTIONAL PCB FOR ASSEMBLING GaN-BASED POWER CONVERTER
- Publication number 20220256707
- Publication date Aug 11, 2022
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Yanbo ZOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-FUNCTIONAL PCB FOR ASSEMBLING GaN-BASED POWER CONVERTER
- Publication number 20220256700
- Publication date Aug 11, 2022
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Yanbo ZOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-FUNCTIONAL PCB FOR ASSEMBLING GaN-BASED POWER CONVERTER AND M...
- Publication number 20220254885
- Publication date Aug 11, 2022
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Yanbo ZOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH EFFICIENCY AND HIGH DENSITY GaN-BASED POWER CONVERTER
- Publication number 20220255447
- Publication date Aug 11, 2022
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Yanbo ZOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH EFFICIENCY AND HIGH DENSITY GaN-BASED POWER CONVERTER
- Publication number 20220255446
- Publication date Aug 11, 2022
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Yanbo ZOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20220043048
- Publication date Feb 10, 2022
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- JIHUA LI
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING HIGH ELECTRON MOBILITY TRANSISTOR
- Publication number 20210132137
- Publication date May 6, 2021
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- Yulin CHEN
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Multi-functional PCB for assembling GaN-based power converter

High efficiency and high density GaN-based power converter and meth...

Multi-functional PCB for assembling GaN-based power converter and m...

High efficiency and high density GaN-based power converter

Multi-functional PCB for assembling GaN-based power converter

High efficiency and high density GaN-based power converter

Device and method for measuring high electron mobility transistor

Device and method for testing semiconductor devices

Device and method for testing semiconductor devices

Patents Applicationslast 30 patents

GaN-BASED SWITCHED-MODE POWER SUPPLY WITH PLANAR TRANSFORMER

GaN-BASED SWITCHED-MODE POWER SUPPLY WITH PLANAR TRANSFORMER

HIGH EFFICIENCY AND HIGH DENSITY GaN-BASED POWER CONVERTER AND METH...

DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICES

MULTI-FUNCTIONAL PCB FOR ASSEMBLING GaN-BASED POWER CONVERTER

MULTI-FUNCTIONAL PCB FOR ASSEMBLING GaN-BASED POWER CONVERTER

MULTI-FUNCTIONAL PCB FOR ASSEMBLING GaN-BASED POWER CONVERTER AND M...

HIGH EFFICIENCY AND HIGH DENSITY GaN-BASED POWER CONVERTER

HIGH EFFICIENCY AND HIGH DENSITY GaN-BASED POWER CONVERTER

DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICES

DEVICE AND METHOD FOR MEASURING HIGH ELECTRON MOBILITY TRANSISTOR