Wenjun Fan

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Albuquerque, NM, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for reducing capacitance and improving high frequency perfor...
- Patent number 8,184,668
- Issue date May 22, 2012
- NeoPhotonics Corporation
- Decai Sun
- G01 - MEASURING TESTING
Information Patent Grant
Method for reducing capacitance and improving high frequency perfor...
- Patent number 7,903,712
- Issue date Mar 8, 2011
- NeoPhotonics Corporation
- Decai Sun
- G01 - MEASURING TESTING
Information Patent Grant
Plasmonic enhanced infrared detector element
- Patent number 7,329,871
- Issue date Feb 12, 2008
- STC.UNM
- Wenjun Fan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR REDUCING CAPACITANCE AND IMPROVING HIGH FREQUENCY PERFOR...
- Publication number 20110096801
- Publication date Apr 28, 2011
- Lightwave Microsystems, Inc.
- Decai Sun
- G01 - MEASURING TESTING
Information Patent Application
Method for reducing capacitance and improving high frequency perfor...
- Publication number 20100061417
- Publication date Mar 11, 2010
- Decai Sun
- G01 - MEASURING TESTING
Information Patent Application
Plasmonic enhanced infrared detector element
- Publication number 20060175551
- Publication date Aug 10, 2006
- Wenjun Fan
- G01 - MEASURING TESTING