Wenjun Fan

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Oxnard, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Probe device for a metrology instrument and method of fabricating t...
- Patent number 7,823,216
- Issue date Oct 26, 2010
- Veeco Instruments Inc.
- Wenjun Fan
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fast-scanning SPM and method of operating same
- Patent number 7,770,231
- Issue date Aug 3, 2010
- Veeco Instruments, Inc.
- Craig Prater
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Probe Device for a Metrology Instrument and Method of Fabricating t...
- Publication number 20090031792
- Publication date Feb 5, 2009
- Wenjun Fan
- G01 - MEASURING TESTING
Information Patent Application
Fast-Scanning SPM and Method of Operating Same
- Publication number 20090032706
- Publication date Feb 5, 2009
- Veeco Instruments Inc.
- Craig Prater
- G01 - MEASURING TESTING