Wenlong Wei

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Mercerville, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for generating, from a test cube set, a generator configured...
- Patent number 7,610,540
- Issue date Oct 27, 2009
- NEC Laboratories America, Inc.
- Kedarnath Balakrishnan
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing logic circuit designs
- Patent number 7,610,539
- Issue date Oct 27, 2009
- NEC Laboratories America, Inc.
- Kedarnath Balakrishnan
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing logic circuit designs
- Patent number 7,484,151
- Issue date Jan 27, 2009
- NEC Laboratories America, Inc.
- Kedarnath Balakrishnan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR TESTING LOGIC CIRCUIT DESIGNS
- Publication number 20090119563
- Publication date May 7, 2009
- NEC Laboratories America, Inc.
- Kedarnath Balakrishnan
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR TESTING LOGIC CIRCUIT DESIGNS
- Publication number 20090119556
- Publication date May 7, 2009
- NEC Laboratories America, Inc.
- Kedarnath Balakrishnan
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Testing an Integrated Circuit
- Publication number 20070266283
- Publication date Nov 15, 2007
- NEC Laboratories America, Inc.
- Kedarnath Balakrishnan
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Testing Logic Circuit Designs
- Publication number 20070113129
- Publication date May 17, 2007
- NEC Laboratories America, Inc.
- Kedarnath Balakrishnan
- G01 - MEASURING TESTING