Wenzhe ZOU

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method for calibrating parameter error of electron probe microanaly...
- Patent number 12,332,195
- Issue date Jun 17, 2025
- Shanghai Institute of Measurement and Testing Technology
- Lihua Lei
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ADJUSTMENT METHOD AND ADJUSTMENT APPARATUS FOR MUTUAL PARALLELISM O...
- Publication number 20240393560
- Publication date Nov 28, 2024
- Shanghai Institue of Measurement and Testing Technology
- Lihua LEI
- G02 - OPTICS
Information Patent Application
METHOD FOR CALIBRATING PARAMETER ERROR OF ELECTRON PROBE MICROANALY...
- Publication number 20240151666
- Publication date May 9, 2024
- Shanghai Institute of Measurement and Testing Technology
- Lihua LEI
- G01 - MEASURING TESTING