Werner Doppen

Person

  • Eberfing, DE

Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analyzer

    • Patent number 8,580,196
    • Issue date Nov 12, 2013
    • Hitachi High-Technologies Corporation
    • Yasunao Awata
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer

    • Patent number 8,409,507
    • Issue date Apr 2, 2013
    • Hitachi High-Technologies Corporation
    • Hirokazu Iwamatsu
    • G01 - MEASURING TESTING