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Werner Doppen
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Eberfing, DE
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last 30 patents
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Patent Grant
Automatic analyzer
Patent number
8,580,196
Issue date
Nov 12, 2013
Hitachi High-Technologies Corporation
Yasunao Awata
G01 - MEASURING TESTING
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Patent Grant
Automatic analyzer
Patent number
8,409,507
Issue date
Apr 2, 2013
Hitachi High-Technologies Corporation
Hirokazu Iwamatsu
G01 - MEASURING TESTING