Werner Hickel

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Mannheim, DE

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Patents Grantslast 30 patents

Information Patent Grant
Determination of refractive index and thickness of thin layers
- Patent number 5,237,392
- Issue date Aug 17, 1993
- BASF Aktiengesellschaft
- Werner Hickel
- G01 - MEASURING TESTING
Information Patent Grant
Examination of the physical properties of thin films
- Patent number 5,141,311
- Issue date Aug 25, 1992
- BASF Aktiengesellschaft
- Werner Hickel
- G01 - MEASURING TESTING
Information Patent Grant
Reading out information stored in thin polymer layers
- Patent number 5,049,462
- Issue date Sep 17, 1991
- BASF Aktiengesellschaft
- Dirk Funhoff
- G11 - INFORMATION STORAGE
Information Patent Grant
Examination of surface structure
- Patent number 5,028,132
- Issue date Jul 2, 1991
- BASF Aktiengesellschaft
- Werner Hickel
- G01 - MEASURING TESTING