Wieland E. Von Behrens

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Dallas, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Optical device and method for multi-angle laser light scatter
- Patent number 6,646,742
- Issue date Nov 11, 2003
- MWI, Inc.
- Mervin L. Gangstead
- G01 - MEASURING TESTING
Information Patent Grant
Optical system for multi-part differential particle discrimination...
- Patent number 6,507,400
- Issue date Jan 14, 2003
- MWI, Inc.
- Jean-Charles Pina
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for analyzing particulate matter
- Patent number 5,983,735
- Issue date Nov 16, 1999
- MWI, Inc.
- Wieland E. Von Behrens
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for analyzing particulate matter
- Patent number 5,895,869
- Issue date Apr 20, 1999
- MWI, Inc.
- Wieland E. Von Behrens
- G01 - MEASURING TESTING
Information Patent Grant
Method for accurately enumerating and sensitively qualifying hetero...
- Patent number 5,378,633
- Issue date Jan 3, 1995
- Sequoia-Turner Corporation, A Corp. of CA
- Wieland E. von Behrens
- G01 - MEASURING TESTING
Information Patent Grant
Particulate matter analyzing apparatus and method
- Patent number 4,710,021
- Issue date Dec 1, 1987
- Sequoia-Turner Corporation
- Wieland E. von Behrens
- G01 - MEASURING TESTING