Wilbur C. Vogley

Person

Missouri City, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Reduced cost, high speed integrated circuit test arrangement
- Patent number 6,617,872
- Issue date Sep 9, 2003
- Texas Instruments Incorporated
- Wilbur C. Vogley
- G01 - MEASURING TESTING
Information Patent Grant
Reduced cost, high speed circuit test arrangement
- Patent number 6,583,639
- Issue date Jun 24, 2003
- Texas Instruments Incorporated
- Wilbur C. Vogley
- G01 - MEASURING TESTING
Information Patent Grant
High-speed clock circuit for semiconductor memory device
- Patent number 6,285,625
- Issue date Sep 4, 2001
- Texas Instruments Incorporated
- Wilbur C. Vogley
- G11 - INFORMATION STORAGE
Information Patent Grant
Synchronous data storage system having re-drive circuits for reduce...
- Patent number 6,260,106
- Issue date Jul 10, 2001
- Texas Instruments Incorporated
- Wilbur C. Vogley
- G11 - INFORMATION STORAGE
Information Patent Grant
Synchronous memory and data processing system having a programmable...
- Patent number 6,230,250
- Issue date May 8, 2001
- Texas Instruments Incorporated
- Wilbur Christian Vogley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Synchronous dynamic random access memory and data processing system...
- Patent number 6,223,264
- Issue date Apr 24, 2001
- Texas Instruments Incorporated
- Wilbur Christian Vogley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data processing system having a synchronous memory with an output c...
- Patent number 6,219,746
- Issue date Apr 17, 2001
- Texas Instruments Incorporated
- Wilbur Christian Vogley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Synchronous memory and data processing system having a programmable...
- Patent number 6,212,596
- Issue date Apr 3, 2001
- Texas Instruments Incorporated
- Wilbur Christian Vogley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test system and process with a microcomputer at each test location
- Patent number 6,114,870
- Issue date Sep 5, 2000
- Texas Instruments Incorporated
- Wilbur C. Vogley
- G01 - MEASURING TESTING
Information Patent Grant
High-speed memory arranged for operating synchronously with a micro...
- Patent number 6,088,280
- Issue date Jul 11, 2000
- Texas Instruments Incorporated
- Wilbur Christian Vogley
- G11 - INFORMATION STORAGE
Information Patent Grant
High speed integrated circuit interconnection having proximally loc...
- Patent number 6,064,254
- Issue date May 16, 2000
- Texas Instruments Incorporated
- Wilbur C. Vogley
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Selectable integrated circuit assembly and method of operation
- Patent number 6,028,781
- Issue date Feb 22, 2000
- Texas Instruments Incorporated
- Wilbur C. Vogley
- G11 - INFORMATION STORAGE
Information Patent Grant
High speed memory arranged for operating synchronously with a micro...
- Patent number 5,982,694
- Issue date Nov 9, 1999
- Texas Instruments Incorporated
- Wilbur Christian Vogley
- G11 - INFORMATION STORAGE
Information Patent Grant
Data processing system arranged for operating synchronously with a...
- Patent number 5,912,854
- Issue date Jun 15, 1999
- Texas Instruments Incorporated
- Wilbur Christian Vogley
- G11 - INFORMATION STORAGE
Information Patent Grant
Test system and process with microcomputers and serial interface
- Patent number 5,907,247
- Issue date May 25, 1999
- Texas Instruments Incorporated
- Wilbur C. Vogley
- G01 - MEASURING TESTING
Information Patent Grant
Random access memory with latency arranged for operating synchronou...
- Patent number 5,808,958
- Issue date Sep 15, 1998
- Texas Instruments Incorporated
- Wilbur Christian Vogley
- G11 - INFORMATION STORAGE
Information Patent Grant
Time skewing arrangement for operating memory in synchronism with a...
- Patent number 5,615,358
- Issue date Mar 25, 1997
- Texas Instruments Incorporated
- Wilbur C. Vogley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Time skewing arrangement for operating memory devices in synchronis...
- Patent number 5,608,896
- Issue date Mar 4, 1997
- Texas Instruments Incorporated
- Wilbur C. Vogley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Random access memory arranged for operating synchronously with a mi...
- Patent number 5,587,954
- Issue date Dec 24, 1996
- Texas Instruments Incorporated
- Wilbur C. Vogley
- G11 - INFORMATION STORAGE
Information Patent Grant
Time skewing arrangement for operating random access memory in sync...
- Patent number 5,572,722
- Issue date Nov 5, 1996
- Texas Instruments Incorporated
- Wilbur C. Vogley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Time skewing arrangement for operating memory in synchronism with a...
- Patent number 5,560,000
- Issue date Sep 24, 1996
- Texas Instruments Incorporated
- Wilbur C. Vogley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System including a data processor, a synchronous dram, a peripheral...
- Patent number 5,390,149
- Issue date Feb 14, 1995
- Texas Instruments Incorporated
- Wilbur C. Vogley
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Reduced cost, high speed integrated circuit test arrangement
- Publication number 20020109523
- Publication date Aug 15, 2002
- Wilbur C. Vogley
- G01 - MEASURING TESTING

Wilbur C. Vogley

Person

Patents Grantslast 30 patents

Reduced cost, high speed integrated circuit test arrangement

Reduced cost, high speed circuit test arrangement

High-speed clock circuit for semiconductor memory device

Synchronous data storage system having re-drive circuits for reduce...

Synchronous memory and data processing system having a programmable...

Synchronous dynamic random access memory and data processing system...

Data processing system having a synchronous memory with an output c...

Synchronous memory and data processing system having a programmable...

Test system and process with a microcomputer at each test location

High-speed memory arranged for operating synchronously with a micro...

High speed integrated circuit interconnection having proximally loc...

Selectable integrated circuit assembly and method of operation

High speed memory arranged for operating synchronously with a micro...

Data processing system arranged for operating synchronously with a...

Test system and process with microcomputers and serial interface

Random access memory with latency arranged for operating synchronou...

Time skewing arrangement for operating memory in synchronism with a...

Time skewing arrangement for operating memory devices in synchronis...

Random access memory arranged for operating synchronously with a mi...

Time skewing arrangement for operating random access memory in sync...

Time skewing arrangement for operating memory in synchronism with a...

System including a data processor, a synchronous dram, a peripheral...

Patents Applicationslast 30 patents

Reduced cost, high speed integrated circuit test arrangement