Wilbur I. Kaye

Person

Fullerton, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Automated optical alignment system and method using Raman scatterin...
- Patent number 5,614,726
- Issue date Mar 25, 1997
- Beckman Instruments, Inc.
- Wilbur I. Kaye
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced fluorescence detection of samples in capillary column
- Patent number 5,484,571
- Issue date Jan 16, 1996
- Beckman Instruments, Inc.
- Stephen L. Pentoney
- G01 - MEASURING TESTING
Information Patent Grant
Detecting a radiation signal
- Patent number 5,292,483
- Issue date Mar 8, 1994
- Beckman Instruments, Inc.
- Wilbur I. Kaye
- G01 - MEASURING TESTING
Information Patent Grant
Stray radiation compensation
- Patent number 5,128,549
- Issue date Jul 7, 1992
- Beckman Instruments, Inc.
- Wilbur I. Kaye
- G01 - MEASURING TESTING
Information Patent Grant
Stray light measurement and compensation
- Patent number 4,526,470
- Issue date Jul 2, 1985
- Beckman Instruments, Inc.
- Wilbur I. Kaye
- G01 - MEASURING TESTING
Information Patent Grant
Marking and authenticating documents with liquid crystal materials
- Patent number 4,514,085
- Issue date Apr 30, 1985
- Beckman Instruments, Inc.
- Wilbur I. Kaye
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for minimizing beam collimation sensitivity in optical in...
- Patent number 4,497,542
- Issue date Feb 5, 1985
- Beckman Instruments, Inc.
- Wilbur I. Kaye
- G02 - OPTICS
Information Patent Grant
Wavelength accuracy test solution
- Patent number 4,461,718
- Issue date Jul 24, 1984
- Beckman Instruments, Inc.
- Wilbur I. Kaye
- G01 - MEASURING TESTING
Information Patent Grant
Narrow band rejection filter utilizing a liquid crystal cell
- Patent number 4,444,469
- Issue date Apr 24, 1984
- Beckman Instruments, Inc.
- Wilbur I. Kaye
- G02 - OPTICS
Information Patent Grant
Control of detector gain hysteresis in a single beam spectrophotometer
- Patent number 4,437,762
- Issue date Mar 20, 1984
- Beckman Instruments, Inc.
- Thomas J. Glenn
- G01 - MEASURING TESTING
Information Patent Grant
Control of detector gain hysteresis in a single beam spectrophotometer
- Patent number 4,437,763
- Issue date Mar 20, 1984
- Beckman Instruments, Inc.
- Wilbur I. Kaye
- G01 - MEASURING TESTING
Information Patent Grant
Liquid crystal tuned birefringent filter
- Patent number 4,394,069
- Issue date Jul 19, 1983
- Beckman Instruments, Inc.
- Wilbur I. Kaye
- G02 - OPTICS
Information Patent Grant
Reduction of hysteresis in photomultiplier detectors
- Patent number 4,367,404
- Issue date Jan 4, 1983
- Beckman Instruments, Inc.
- Wilbur I. Kaye
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Near-simultaneous measurements at forward and back scatter angles i...
- Patent number 4,355,897
- Issue date Oct 26, 1982
- Beckman Instruments, Inc.
- Wilbur I. Kaye
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining the wavelength of light
- Patent number 4,272,195
- Issue date Jun 9, 1981
- Beckman Instruments, Inc.
- Wilbur I. Kaye
- G02 - OPTICS
Information Patent Grant
Detector apparatus for laser light scattering photometers
- Patent number 4,027,973
- Issue date Jun 7, 1977
- Beckman Instruments, Inc.
- Wilbur I. Kaye
- G01 - MEASURING TESTING

Wilbur I. Kaye

Person

Patents Grantslast 30 patents

Automated optical alignment system and method using Raman scatterin...

Enhanced fluorescence detection of samples in capillary column

Detecting a radiation signal

Stray radiation compensation

Stray light measurement and compensation

Marking and authenticating documents with liquid crystal materials

Apparatus for minimizing beam collimation sensitivity in optical in...

Wavelength accuracy test solution

Narrow band rejection filter utilizing a liquid crystal cell

Control of detector gain hysteresis in a single beam spectrophotometer

Control of detector gain hysteresis in a single beam spectrophotometer

Liquid crystal tuned birefringent filter

Reduction of hysteresis in photomultiplier detectors

Near-simultaneous measurements at forward and back scatter angles i...

Method and apparatus for determining the wavelength of light

Detector apparatus for laser light scattering photometers