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Wilfred Hartmann
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Gechingen, DE
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last 30 patents
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Patent Grant
Test circuit and method for interconnect testing of chips
Patent number
6,219,811
Issue date
Apr 17, 2001
International Business Machines Corporation
Mathias Gruetzner
G01 - MEASURING TESTING
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Patent Grant
Test circuit and system for interconnect testing of high-level pack...
Patent number
6,029,261
Issue date
Feb 22, 2000
International Business Machines Corporation
Wilfred Hartmann
G01 - MEASURING TESTING