Wilfred Pau

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for etching having a controlled distribution of process results
- Patent number 7,648,914
- Issue date Jan 19, 2010
- Applied Materials, Inc.
- Thomas J. Kropewnicki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of detecting an endpoint during etching of a material within...
- Patent number 6,635,573
- Issue date Oct 21, 2003
- Applied Materials, Inc.
- Wilfred Pau
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR ETCHING WITH HARDMASK
- Publication number 20070161255
- Publication date Jul 12, 2007
- Wilfred Pau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for etching having a controlled distribution of process results
- Publication number 20070042603
- Publication date Feb 22, 2007
- Thomas J. Kropewnicki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of detecting an endpoint during etching of a material within...
- Publication number 20030082919
- Publication date May 1, 2003
- APPLIED MATERIALS, INC.
- Wilfred Pau
- H01 - BASIC ELECTRIC ELEMENTS