Wilfried Vandervorst

Person

Mechelen, BE

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for aligning a probe for scanning probe micros...
- Patent number 11,549,963
- Issue date Jan 10, 2023
- Imec VZW
- Kristof Paredis
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring surface characteristics of a material
- Patent number 11,125,805
- Issue date Sep 21, 2021
- Imec VZW
- Kristof Paredis
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining the shape of a sample tip for atom probe tom...
- Patent number 10,746,759
- Issue date Aug 18, 2020
- Imec VZW
- Kristof Paredis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for transmission electron microscopy
- Patent number 10,541,108
- Issue date Jan 21, 2020
- Imec VZW
- Umberto Celano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for two dimensional active carrier profiling of s...
- Patent number 10,495,666
- Issue date Dec 3, 2019
- Imec VZW
- Kristof Paredis
- G01 - MEASURING TESTING
Information Patent Grant
Method for differential heating of elongate nano-scaled structures
- Patent number 10,014,178
- Issue date Jul 3, 2018
- Imec VZW
- Wilfried Vandervorst
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe configuration and method of fabrication thereof
- Patent number 9,612,258
- Issue date Apr 4, 2017
- IMEC
- Thomas Hantschel
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for determining local resistivity and carrier concentration...
- Patent number 9,588,137
- Issue date Mar 7, 2017
- IMEC
- Pierre Eyben
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Tunnel field-effect transistor and methods for manufacturing thereof
- Patent number 8,872,230
- Issue date Oct 28, 2014
- IMEC
- Anne S. Verhulst
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining the active doping concentration of a doped s...
- Patent number 8,717,570
- Issue date May 6, 2014
- IMEC
- Janusz Bogdanowicz
- G01 - MEASURING TESTING
Information Patent Grant
Method for cost-efficient manufacturing diamond tips for ultra-high...
- Patent number 8,484,761
- Issue date Jul 9, 2013
- IMEC
- Thomas Hantschel
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Wavelength-sensitive detector comprising photoconductor units each...
- Patent number 8,232,517
- Issue date Jul 31, 2012
- IMEC
- Anne S. Verhulst
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating a high-K dielectric layer
- Patent number 8,211,812
- Issue date Jul 3, 2012
- IMEC
- Lars-Ake Ragnarsson
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Wavelength-sensitive detector with elongate nanostructures
- Patent number 7,598,482
- Issue date Oct 6, 2009
- IMEC
- Anne S. Verhulst
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for measuring properties of a semiconductor subst...
- Patent number 7,133,128
- Issue date Nov 7, 2006
- Interuniversitair Microelektronica Centrum (IMEC) VZW
- Trudo Clarysse
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for performing atomic force microscopy measure...
- Patent number 6,823,723
- Issue date Nov 30, 2004
- Interuniversitair Microelektronica Centrum (IMEC)
- Wilfried Vandervorst
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for local surface analysis
- Patent number 6,809,317
- Issue date Oct 26, 2004
- Interuniversitair Microelektronica Centrum (IMEC)
- Wilfried Vandervorst
- G01 - MEASURING TESTING
Information Patent Grant
Probe tip and method of manufacturing probe tips by peel-off
- Patent number 6,756,584
- Issue date Jun 29, 2004
- Interuniversitair Microelektronica Centrum (IMEC)
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Grant
Probe and method of manufacturing mounted AFM probes
- Patent number 6,690,008
- Issue date Feb 10, 2004
- Interuniversitair Microelektronica Centrum (IMEC)
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Grant
Probe tip configuration and a method of fabrication thereof
- Patent number 6,504,152
- Issue date Jan 7, 2003
- Imec VZW
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Grant
Probe tip configuration and a method of fabrication thereof
- Patent number 6,328,902
- Issue date Dec 11, 2001
- Imec VZW
- Thomas Hantschel
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for measuring the electrical potential in a semiconductor el...
- Patent number 6,201,401
- Issue date Mar 13, 2001
- IMEC
- Louis C. Hellemans
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring the electrical potential in a semiconductor el...
- Patent number 6,091,248
- Issue date Jul 18, 2000
- IMEC vzw
- Louis C. Hellemans
- G01 - MEASURING TESTING
Information Patent Grant
Database and method for measurement correction for cross-sectional...
- Patent number 5,995,912
- Issue date Nov 30, 1999
- IMEC vzw
- Peter DeWolf
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring the electrical potential in a semiconductor el...
- Patent number 5,723,981
- Issue date Mar 3, 1998
- IMEC vzw
- Louis C. Hellemans
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for determining the resistance and carrier profile of a semi...
- Patent number 5,585,734
- Issue date Dec 17, 1996
- Interuniversitair Micro-Elektronica Centrum VZW
- Marc A. J. Meuris
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for resistance measurements on a semiconductor element with...
- Patent number 5,369,372
- Issue date Nov 29, 1994
- Interuniversitair Micro-Elektronica Centrum vzw
- Wilfried Vandervorst
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
A RECONSTRUCTION METHOD FOR ATOM PROBE TOMOGRAPHY
- Publication number 20230307207
- Publication date Sep 28, 2023
- UNIVERSITEIT ANTWERPEN
- Jan SIJBERS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Aligning a Probe for Scanning Probe Micros...
- Publication number 20220065895
- Publication date Mar 3, 2022
- IMEC vzw
- Kristof Paredis
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR MEASURING SURFACE CHARACTERISTICS OF A MATERIAL
- Publication number 20200033395
- Publication date Jan 30, 2020
- IMEC vzw
- Kristof Paredis
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZATION OF REGIONS WITH DIFFERENT CRYSTALLINITY IN MATERIALS
- Publication number 20200006034
- Publication date Jan 2, 2020
- IMEC vzw
- Andreas Schulze
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETERMINING THE SHAPE OF A SAMPLE TIP FOR ATOM PROBE TOM...
- Publication number 20190277881
- Publication date Sep 12, 2019
- IMEC vzw
- Kristof Paredis
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR TWO DIMENSIONAL ACTIVE CARRIER PROFILING OF S...
- Publication number 20190025341
- Publication date Jan 24, 2019
- IMEC vzw
- Kristof Paredis
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR TRANSMISSION ELECTRON MICROSCOPY
- Publication number 20180240642
- Publication date Aug 23, 2018
- IMEC vzw
- Umberto Celano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Differential Heating of Elongate Nano-Scaled Structures
- Publication number 20170178910
- Publication date Jun 22, 2017
- IMEC vzw
- Wilfried Vandervorst
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR ATOMIC FORCE MICROSCOPY
- Publication number 20150226766
- Publication date Aug 13, 2015
- Bruker Nano, Inc.
- Kristof Paredis
- G01 - MEASURING TESTING
Information Patent Application
PROBE CONFIGURATION AND METHOD OF FABRICATION THEREOF
- Publication number 20150185249
- Publication date Jul 2, 2015
- IMEC
- Thomas HANTSCHEL
- G01 - MEASURING TESTING
Information Patent Application
Method for Determining Local Resistivity and Carrier Concentration...
- Publication number 20140068822
- Publication date Mar 6, 2014
- IMEC
- Pierre Eyben
- B82 - NANO-TECHNOLOGY
Information Patent Application
TUNNEL FIELD-EFFECT TRANSISTOR AND METHODS FOR MANUFACTURING THEREOF
- Publication number 20130161696
- Publication date Jun 27, 2013
- IMEC
- Anne S. Verhulst
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETERMINING THE ACTIVE DOPING CONCENTRATION OF A DOPED S...
- Publication number 20130155409
- Publication date Jun 20, 2013
- Katholieke Universiteit Leuven
- Janusz BOGDANOWICZ
- G01 - MEASURING TESTING
Information Patent Application
Laser Atom Probe and Laser Atom Probe Analysis Methods
- Publication number 20120080596
- Publication date Apr 5, 2012
- IMEC
- Wilfried Vandervorst
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Forming Mono-Crystalline Germanium or Silicon Germanium
- Publication number 20110097881
- Publication date Apr 28, 2011
- IMEC
- Wilfried Vandervorst
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAVELENGTH-SENSITIVE DETECTOR WITH ELONGATE NANOSTRUCTURES
- Publication number 20100171025
- Publication date Jul 8, 2010
- IMEC
- Anne S. Verhulst
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR COST-EFFICIENT MANUFACTURING DIAMOND TIPS FOR ULTRA-HIGH...
- Publication number 20090313730
- Publication date Dec 17, 2009
- Interuniversitair Microelektronica Centrum vzw (IMEC)
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Application
WAVELENGTH-SENSITIVE DETECTOR WITH ELONGATE NANOSTRUCTURES
- Publication number 20090266974
- Publication date Oct 29, 2009
- Anne Verhulst
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING A HIGH-K DIELECTRIC LAYER
- Publication number 20080265380
- Publication date Oct 30, 2008
- Interuniversitair Microelektronica Centrum vzw (IMEC)
- Lars-Ake Ragnarsson
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
System and method for measuring properties of a semiconductor subst...
- Publication number 20040064263
- Publication date Apr 1, 2004
- Trudo Clarysse
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for local surface analysis
- Publication number 20030127591
- Publication date Jul 10, 2003
- Wilfried Vandervorst
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for performing atomic force microscopy measure...
- Publication number 20020157457
- Publication date Oct 31, 2002
- Wilfried Vandervorst
- B82 - NANO-TECHNOLOGY
Information Patent Application
Probe and method of manufacturing mounted AFM probes
- Publication number 20020079445
- Publication date Jun 27, 2002
- Thomas Hantschel
- B82 - NANO-TECHNOLOGY
Information Patent Application
Probe tip and method of manufacturing tips and probes for detecting...
- Publication number 20020047091
- Publication date Apr 25, 2002
- Thomas Hantschel
- B82 - NANO-TECHNOLOGY
Information Patent Application
Probe tip configuration and a method of fabrication thereof
- Publication number 20020040884
- Publication date Apr 11, 2002
- Thomas Hantschel
- B82 - NANO-TECHNOLOGY

Wilfried Vandervorst

Person

Patents Grantslast 30 patents

Method and apparatus for aligning a probe for scanning probe micros...

Device for measuring surface characteristics of a material

Method for determining the shape of a sample tip for atom probe tom...

Method and apparatus for transmission electron microscopy

Device and method for two dimensional active carrier profiling of s...

Method for differential heating of elongate nano-scaled structures

Probe configuration and method of fabrication thereof

Method for determining local resistivity and carrier concentration...

Tunnel field-effect transistor and methods for manufacturing thereof

Method for determining the active doping concentration of a doped s...

Method for cost-efficient manufacturing diamond tips for ultra-high...

Wavelength-sensitive detector comprising photoconductor units each...

Method for fabricating a high-K dielectric layer

Wavelength-sensitive detector with elongate nanostructures

System and method for measuring properties of a semiconductor subst...

Method and apparatus for performing atomic force microscopy measure...

Method and apparatus for local surface analysis

Probe tip and method of manufacturing probe tips by peel-off

Probe and method of manufacturing mounted AFM probes

Probe tip configuration and a method of fabrication thereof

Probe tip configuration and a method of fabrication thereof

Method for measuring the electrical potential in a semiconductor el...

Method for measuring the electrical potential in a semiconductor el...

Database and method for measurement correction for cross-sectional...

Method for measuring the electrical potential in a semiconductor el...

Method for determining the resistance and carrier profile of a semi...

Method for resistance measurements on a semiconductor element with...

Patents Applicationslast 30 patents

A RECONSTRUCTION METHOD FOR ATOM PROBE TOMOGRAPHY

Method and Apparatus for Aligning a Probe for Scanning Probe Micros...

DEVICE FOR MEASURING SURFACE CHARACTERISTICS OF A MATERIAL

CHARACTERIZATION OF REGIONS WITH DIFFERENT CRYSTALLINITY IN MATERIALS

METHOD FOR DETERMINING THE SHAPE OF A SAMPLE TIP FOR ATOM PROBE TOM...

DEVICE AND METHOD FOR TWO DIMENSIONAL ACTIVE CARRIER PROFILING OF S...

METHOD AND APPARATUS FOR TRANSMISSION ELECTRON MICROSCOPY

Method for Differential Heating of Elongate Nano-Scaled Structures

APPARATUS AND METHOD FOR ATOMIC FORCE MICROSCOPY

PROBE CONFIGURATION AND METHOD OF FABRICATION THEREOF

Method for Determining Local Resistivity and Carrier Concentration...

TUNNEL FIELD-EFFECT TRANSISTOR AND METHODS FOR MANUFACTURING THEREOF

METHOD FOR DETERMINING THE ACTIVE DOPING CONCENTRATION OF A DOPED S...

Laser Atom Probe and Laser Atom Probe Analysis Methods

Method of Forming Mono-Crystalline Germanium or Silicon Germanium

WAVELENGTH-SENSITIVE DETECTOR WITH ELONGATE NANOSTRUCTURES

METHOD FOR COST-EFFICIENT MANUFACTURING DIAMOND TIPS FOR ULTRA-HIGH...

WAVELENGTH-SENSITIVE DETECTOR WITH ELONGATE NANOSTRUCTURES

METHOD FOR FABRICATING A HIGH-K DIELECTRIC LAYER

System and method for measuring properties of a semiconductor subst...

Method and apparatus for local surface analysis

Method and apparatus for performing atomic force microscopy measure...

Probe and method of manufacturing mounted AFM probes

Probe tip and method of manufacturing tips and probes for detecting...

Probe tip configuration and a method of fabrication thereof