Wilhelm A. Sauerwald

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Testing integrated circuits provided on a carrier
- Patent number 5,657,329
- Issue date Aug 12, 1997
- U.S. Philips Corporation
- Wilhelm A. Sauerwald
- G01 - MEASURING TESTING
Information Patent Grant
Testing integrated circuits provided on a carrier
- Patent number 5,430,735
- Issue date Jul 4, 1995
- U.S. Philips Corporation
- Wilhelm A. Sauerwald
- G01 - MEASURING TESTING
Information Patent Grant
Electronic module comprising a first substrate element with a funct...
- Patent number 4,967,142
- Issue date Oct 30, 1990
- U.S. Philips Corporation
- Wilhelm A. Sauerwald
- G01 - MEASURING TESTING
Information Patent Grant
Testable carriers for integrated circuits
- Patent number 4,879,717
- Issue date Nov 7, 1989
- U.S. Philips Corp.
- Wilhelm A. Sauerwald
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuits, carriers therefor and testing apparatus and me...
- Patent number 4,791,358
- Issue date Dec 13, 1988
- U.S. Philips Corporation
- Wilhelm A. Sauerwald
- G01 - MEASURING TESTING