Wilhelm Schebesta

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Jena, DE

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Patents Grantslast 30 patents

Information Patent Grant
Standard for wavelength and intensity for spectrometers
- Patent number 8,836,938
- Issue date Sep 16, 2014
- Carl Zeiss Microscopy GmbH
- Wilhelm Schebesta
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometric measuring probe and method for recalibrating the same
- Patent number 7,671,984
- Issue date Mar 2, 2010
- Carl Zeiss MicroImaging GmbH
- Wilhelm Schebesta
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer
- Patent number 6,606,156
- Issue date Aug 12, 2003
- Gretag-Macbeth AG
- Peter Ehbets
- G01 - MEASURING TESTING
Information Patent Grant
Process and apparatus for spectral reflectance and transmission mea...
- Patent number 5,764,352
- Issue date Jun 9, 1998
- Balzers Und Leybold Deutschland Holding AG
- Peter Kappel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Arrangement for Determining the Reflectivity of a Sample
- Publication number 20110007319
- Publication date Jan 13, 2011
- CARL ZEISS MICROIMAGING GMBH
- Nico Correns
- G01 - MEASURING TESTING
Information Patent Application
STANDARD FOR WAVELENGTH AND INTENSITY FOR SPECTROMETERS
- Publication number 20090002696
- Publication date Jan 1, 2009
- Carl Zeiss Micromaging GmbH
- WILHELM SCHEBESTA
- G01 - MEASURING TESTING
Information Patent Application
Spectrometric Measuring Probe and Method for Recalibrating the Same
- Publication number 20070236692
- Publication date Oct 11, 2007
- Wilhelm Schebesta
- G01 - MEASURING TESTING
Information Patent Application
Optical measuring arrangement, in particular for quality control in...
- Publication number 20030202180
- Publication date Oct 30, 2003
- Juergen Gobel
- G01 - MEASURING TESTING
Information Patent Application
Optical measuring arrangement, in particular for quality control in...
- Publication number 20020001078
- Publication date Jan 3, 2002
- Juergen Gobel
- G01 - MEASURING TESTING