Wilhelmus J. J. Welters

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
X-ray examination apparatus including an X-ray filter
- Patent number 6,181,774
- Issue date Jan 30, 2001
- U.S. Philips Corporation
- Menno W. J. Prins
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
X-ray examination apparatus including a filter
- Patent number 6,118,855
- Issue date Sep 12, 2000
- U.S. Philips Corporation
- Wilhelmus J. J. Welters
- G01 - MEASURING TESTING
Information Patent Grant
X-ray examination apparatus including an x-ray filter
- Patent number 6,061,426
- Issue date May 9, 2000
- U.S. Philips Corporation
- Petrus W. J. Linders
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray examination apparatus including an x-ray filter
- Patent number 5,966,426
- Issue date Oct 12, 1999
- U.S. Philips Corporation
- Johannes Marra
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray examination apparatus comprising a filter
- Patent number 5,751,786
- Issue date May 12, 1998
- U.S. Philips Corporation
- Wilhelmus J. J. Welters
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING