Wilhelmus Jacobus Maria Rooijakkers

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Waalre, NL

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Patents Grantslast 30 patents

Information Patent Grant
Radiation detector
- Patent number 8,269,186
- Issue date Sep 18, 2012
- ASML Netherlands B.V.
- Wilhelmus Jacobus Maria Rooijakkers
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Radiation detector
- Patent number 8,124,939
- Issue date Feb 28, 2012
- ASML Netherlands B.V.
- Wilhelmus Jacobus Maria Rooijakkers
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Radiation Detector
- Publication number 20120091357
- Publication date Apr 19, 2012
- ASML NETHERLANDS B.V.
- Wilhelmus Jacobus Maria Rooijakkers
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Lithographic Apparatus, Aberration Detector and Device Manufacturin...
- Publication number 20120026477
- Publication date Feb 2, 2012
- ASML Neitherlands B.V.
- Wilhelmus Jacobus Maria ROOIJAKKERS
- G01 - MEASURING TESTING
Information Patent Application
Radiation Detector
- Publication number 20110220806
- Publication date Sep 15, 2011
- ASML NETHERLANDS B.V.
- Wilhelmus Jacobus Maria Rooijakkers
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Passive reticle tool, a lithographic apparatus and a method of patt...
- Publication number 20100182582
- Publication date Jul 22, 2010
- ASML NETHERLANDS B.V,
- Marcus Adrianus Van De Kerkhof
- G01 - MEASURING TESTING
Information Patent Application
Lithographic projection system and projection lens polarization sensor
- Publication number 20100118288
- Publication date May 13, 2010
- Marcus Adrianus Van De Kerkhof
- G01 - MEASURING TESTING
Information Patent Application
Lithographic Apparatus, Method for Determining at Least One Polariz...
- Publication number 20100045956
- Publication date Feb 25, 2010
- ASML NETHERLANDS B.V.
- Marcus Adrianus Van De Kerkhof
- G01 - MEASURING TESTING