Will Hsu

Person

Hsin-Chu City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for defect-based scan analysis
- Patent number 7,971,119
- Issue date Jun 28, 2011
- aiwan Semiconductor Manufacturing Company, Ltd.
- Will Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Global positioning system
- Patent number 6,392,591
- Issue date May 21, 2002
- Evermore Technology, Inc.
- William Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Real-time compressing and decompressing apparatus for recording and...
- Patent number 6,252,830
- Issue date Jun 26, 2001
- William Hsu
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for improving wafer topography to provide more accurate tran...
- Patent number 6,214,722
- Issue date Apr 10, 2001
- United Microelectronics Corp.
- Chien-Chih Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of etching metal with increased etching selectivity
- Patent number 5,994,225
- Issue date Nov 30, 1999
- United Microelectronics Corp.
- Ming-Tsung Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of forming a bonding pad
- Patent number 5,834,365
- Issue date Nov 10, 1998
- United Microelectronics Corp.
- Liu Ming-Tsung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bonding pad structure and method thereof
- Patent number 5,703,408
- Issue date Dec 30, 1997
- United Microelectronics Corporation
- Liu Ming-Tsung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making layout design to eliminate process antenna effect
- Patent number 5,514,623
- Issue date May 7, 1996
- United Microelectronics Corporation
- Joe Ko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Layout design to eliminate process antenna effect
- Patent number 5,393,701
- Issue date Feb 28, 1995
- United Microelectronics Corporation
- Joe Ko
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
System and Method for Defect-Based Scan Analysis
- Publication number 20070089001
- Publication date Apr 19, 2007
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Will Hsu
- G01 - MEASURING TESTING
Information Patent Application
Searching apparatus
- Publication number 20020186164
- Publication date Dec 12, 2002
- William Hsu
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing interconnect
- Publication number 20010018265
- Publication date Aug 30, 2001
- Chien-Chih Lin
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

System and method for defect-based scan analysis

Global positioning system

Real-time compressing and decompressing apparatus for recording and...

Method for improving wafer topography to provide more accurate tran...

Method of etching metal with increased etching selectivity

Method of forming a bonding pad

Bonding pad structure and method thereof

Method of making layout design to eliminate process antenna effect

Layout design to eliminate process antenna effect

Patents Applicationslast 30 patents

System and Method for Defect-Based Scan Analysis

Searching apparatus

Method of manufacturing interconnect