Willard Charles Raymond

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Plymouth, MN, US

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Patents Grantslast 30 patents

Information Patent Grant
Automated wafer defect inspection system using backside illumination
- Patent number 7,629,993
- Issue date Dec 8, 2009
- Rudolph Technologies, Inc.
- Mark Harless
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Automated wafer defect inspection system using backside illumination
- Publication number 20040061779
- Publication date Apr 1, 2004
- Mark Harless
- G01 - MEASURING TESTING