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Willard E. Conley
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Austin, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Integrated circuit with degradation monitoring
Patent number
9,229,051
Issue date
Jan 5, 2016
FREESCALE SEMICONDUCTOR, INC.
Puneet Sharma
G01 - MEASURING TESTING
Information
Patent Grant
Method of forming a semiconductor device having dummy features
Patent number
7,741,221
Issue date
Jun 22, 2010
FREESCALE SEMICONDUCTOR, INC.
Ruiqi Tian
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
INTEGRATED CIRCUIT WITH DEGRADATION MONITORING
Publication number
20140132315
Publication date
May 15, 2014
Puneet Sharma
G01 - MEASURING TESTING
Information
Patent Application
Method of forming a semiconductor device having dummy features
Publication number
20070134921
Publication date
Jun 14, 2007
Ruiqi Tian
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device and method for elimination of resist linewidth...
Publication number
20050026084
Publication date
Feb 3, 2005
Cesar M. Garza
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method of designing a reticle and forming a semiconductor device th...
Publication number
20040248016
Publication date
Dec 9, 2004
Kevin D. Lucas
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY