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Willem Gerhardus Johanne Langeveld
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Menlo Park, CA, US
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last 30 patents
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Patent Application
System and Method for X-Ray Source Weight Reduction
Publication number
20120321049
Publication date
Dec 20, 2012
Willem Gerhardus Johanne Langeveld
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
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Patent Application
RADIOACTIVE/NUCLEAR THREAT MONITORING USING LONG DETECTORS
Publication number
20120153168
Publication date
Jun 21, 2012
Willem Gerhardus Johannes Langeveld
G01 - MEASURING TESTING
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Patent Application
High-Energy X-Ray-Spectroscopy-Based Inspection System and Methods...
Publication number
20110235777
Publication date
Sep 29, 2011
Tsahi Gozani
G01 - MEASURING TESTING
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Patent Application
Method and System for Extracting Spectroscopic Information from Ima...
Publication number
20110096906
Publication date
Apr 28, 2011
Willem Gerhardus Johanne Langeveld
G01 - MEASURING TESTING