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Willem Gerhardus Johannes Langeveld
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Menlo Park, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Systems and methods for compton scatter and/or pulse pileup detection
Patent number
11,397,269
Issue date
Jul 26, 2022
Rapiscan Systems, Inc.
Willem Gerhardus Johannes Langeveld
G01 - MEASURING TESTING
Information
Patent Grant
Portable X-ray scanner
Patent number
10,345,479
Issue date
Jul 9, 2019
Rapiscan Systems, Inc.
Willem Gerhardus Johannes Langeveld
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for scanning objects
Patent number
9,435,752
Issue date
Sep 6, 2016
Rapiscan Systems, Inc.
Edward James Morton
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for extracting spectroscopic information from ima...
Patent number
9,404,875
Issue date
Aug 2, 2016
Rapiscan Systems, Inc.
Willem G. J. Langeveld
G01 - MEASURING TESTING
Information
Patent Grant
System and method for X-ray source weight reduction
Patent number
9,224,573
Issue date
Dec 29, 2015
Rapiscan Systems, Inc.
Willem Gerhardus Johannes Langeveld
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Low-dose radiographic imaging system
Patent number
9,218,933
Issue date
Dec 22, 2015
Rapidscan Systems, Inc.
Willem Gerhardus Johannes Langeveld
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Scanning systems
Patent number
9,052,264
Issue date
Jun 9, 2015
Rapiscan Systems, Inc.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for using an intensity-modulated X-ray source
Patent number
8,781,067
Issue date
Jul 15, 2014
Rapiscan Systems, Inc.
Willem G. J. Langeveld
G01 - MEASURING TESTING
Information
Patent Grant
High-energy X-ray-spectroscopy-based inspection system and methods...
Patent number
8,750,454
Issue date
Jun 10, 2014
Rapiscan Systems, Inc.
Tsahi Gozani
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for extracting spectroscopic information from ima...
Patent number
8,724,774
Issue date
May 13, 2014
Rapiscan Systems, Inc.
Willem Gerhardus Johannes Langeveld
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for using an intensity-modulated X-ray source
Patent number
8,437,448
Issue date
May 7, 2013
Rapiscan Systems, Inc.
Willem G. J. Langeveld
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for using an intensity-modulated X-ray source
Patent number
8,054,937
Issue date
Nov 8, 2011
Rapiscan Systems, Inc.
Willem G. J. Langeveld
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Systems and Methods for Compton Scatter And/Or Pulse Pileup Detection
Publication number
20210231819
Publication date
Jul 29, 2021
Rapiscan Systems, Inc.
Willem Gerhardus Johannes Langeveld
G01 - MEASURING TESTING
Information
Patent Application
Portable X-Ray Scanner
Publication number
20170131428
Publication date
May 11, 2017
Rapiscan Systems, Inc.
Willem Gerhardus Johannes Langeveld
G01 - MEASURING TESTING
Information
Patent Application
Ultra-Portable People Screening System
Publication number
20160341847
Publication date
Nov 24, 2016
Rapiscan Systems, Inc.
Luis E. Arroyo
G01 - MEASURING TESTING
Information
Patent Application
Non-Intrusive Inspection Systems and Methods for the Detection of M...
Publication number
20160223706
Publication date
Aug 4, 2016
Rapiscan Systems, Inc.
Edward D. Franco
G01 - MEASURING TESTING
Information
Patent Application
LOW-DOSE RADIOGRAPHIC IMAGING SYSTEM
Publication number
20150325401
Publication date
Nov 12, 2015
Rapiscan Systems, Inc.
Willem Gerhardus Johannes Langeveld
G01 - MEASURING TESTING
Information
Patent Application
Method and System for Extracting Spectroscopic Information from Ima...
Publication number
20140341340
Publication date
Nov 20, 2014
Rapiscan Systems, Inc.
Willem G.J. Langeveld
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for X-Ray Source Weight Reduction
Publication number
20140222402
Publication date
Aug 7, 2014
Rapiscan Systems, Inc.
Willem G.J. Langeveld
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Using an Intensity-Modulated X-Ray Source
Publication number
20130329855
Publication date
Dec 12, 2013
Rapiscan Systems, Inc.
Willem G.J. Langeveld
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Scanning Objects
Publication number
20130129043
Publication date
May 23, 2013
Edward James Morton
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR USING AN INTENSITY-MODULATED X-RAY SOURCE
Publication number
20120257719
Publication date
Oct 11, 2012
Willem G.J. Langeveld
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Using An Intensity-Modulated X-Ray Source
Publication number
20100034355
Publication date
Feb 11, 2010
Willem G.J. Langeveld
G01 - MEASURING TESTING