Willem Louis Van Mierlo

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Veldhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Method for calibrating a scanning charged particle microscope
- Patent number 11,972,922
- Issue date Apr 30, 2024
- ASML Netherlands B.V.
- Hermanus Adrianus Dillen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for controlling a manufacturing process and associated appar...
- Patent number 11,796,920
- Issue date Oct 24, 2023
- ASML Netherlands B.V.
- Jochem Sebastiaan Wildenberg
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for calibrating a scanning charged particle microscope
- Patent number 11,646,174
- Issue date May 9, 2023
- ASML Netherlands, B.V.
- Hermanus Adrianus Dillen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS TO DETERMINE OVERLAY
- Publication number 20250044709
- Publication date Feb 6, 2025
- ASML NETHERLANDS B.V.
- Willem Louis VAN MIERLO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ALIGNING A DISTORTED IMAGE
- Publication number 20240297013
- Publication date Sep 5, 2024
- ASML NETHERLANDS B.V.
- Jasper Frans Mathijs VAN RENS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CALIBRATING A SCANNING CHARGED PARTICLE MICROSCOPE
- Publication number 20230245851
- Publication date Aug 3, 2023
- ASML NETHERLANDS B.V.
- Hermanus Adrianus DILLEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CONTROLLING A MANUFACTURING PROCESS AND ASSOCIATED APPAR...
- Publication number 20230082858
- Publication date Mar 16, 2023
- ASML NETHERLANDS B.V.
- Jochem Sebastiaan WILDENBERG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR CALIBRATING A SCANNING CHARGED PARTICLE MICROSCOPE
- Publication number 20200211819
- Publication date Jul 2, 2020
- ASML NETHERLANDS B.V.
- Hermanus Adrianus DILLEN
- H01 - BASIC ELECTRIC ELEMENTS