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Willem Marie Julia Marcel Coene
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Asten, NL
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last 30 patents
Information
Patent Grant
Metrology system and method for determining a characteristic of one...
Patent number
12,007,700
Issue date
Jun 11, 2024
ASML Netherlands B.V.
Patricius Aloysius Jacobus Tinnemans
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for image analysis
Patent number
11,720,029
Issue date
Aug 8, 2023
ASML NETHERLANDS B.V.
Scott Anderson Middlebrooks
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,692,948
Issue date
Jul 4, 2023
ASML Netherlands B.V.
Nitish Kumar
G01 - MEASURING TESTING
Information
Patent Grant
Metrology system and method for determining a characteristic of one...
Patent number
11,415,900
Issue date
Aug 16, 2022
ASML Netherlands B.V.
Patricius Aloysius Jacobus Tinnemans
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and apparatus for deriving corrections, method and apparatus...
Patent number
11,243,470
Issue date
Feb 8, 2022
ASML Netherlands B.V.
Nitish Kumar
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and apparatus for image analysis
Patent number
11,143,970
Issue date
Oct 12, 2021
ASML Netherlands B.V.
Scott Anderson Middlebrooks
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Yield estimation and control
Patent number
11,119,414
Issue date
Sep 14, 2021
ASML Netherlands B.V.
Scott Anderson Middlebrooks
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Object identification and comparison
Patent number
10,890,540
Issue date
Jan 12, 2021
ASML Netherlands B.V.
Adrianus Cornelis Matheus Koopman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Metrology system and method for determining a characteristic of one...
Patent number
10,816,909
Issue date
Oct 27, 2020
ASML Netherlands B.V.
Patricius Aloysius Jacobus Tinnemans
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and apparatus for image analysis
Patent number
10,732,513
Issue date
Aug 4, 2020
ASML Netherlands B.V.
Scott Anderson Middlebrooks
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Yield estimation and control
Patent number
10,627,723
Issue date
Apr 21, 2020
ASML Netherlands B.V.
Scott Anderson Middlebrooks
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for image analysis
Patent number
10,607,334
Issue date
Mar 31, 2020
ASML Netherlands B.V.
Scott Anderson Middlebrooks
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Alignment system
Patent number
10,585,363
Issue date
Mar 10, 2020
ASML Netherlands B.V.
Simon Gijsbert Josephus Mathijssen
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and apparatus for image analysis
Patent number
10,437,157
Issue date
Oct 8, 2019
ASML Netherlands B.V.
Scott Anderson Middlebrooks
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and apparatus for predicting performance of a measurement m...
Patent number
10,379,448
Issue date
Aug 13, 2019
ASML Netherlands B.V.
Simon Gijsbert Josephus Mathijssen
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Inspection apparatus and method, lithographic apparatus, method of...
Patent number
10,234,384
Issue date
Mar 19, 2019
ASML Netherlands B.V.
Willem Marie Julia Marcel Coene
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Metrology method and inspection apparatus, lithographic system and...
Patent number
9,946,167
Issue date
Apr 17, 2018
ASML Netherlands B.V.
Hendrik Jan Hidde Smilde
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Substrate and patterning device for use in metrology, metrology met...
Patent number
9,915,879
Issue date
Mar 13, 2018
ASML Netherlands B.V.
Richard Quintanilha
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Methods and patterning devices for measuring phase aberration
Patent number
9,201,311
Issue date
Dec 1, 2015
ASML Netherlands B.V.
Willem Marie Julia Marcel Coene
G01 - MEASURING TESTING
Information
Patent Grant
Metrology method and inspection apparatus, lithographic system and...
Patent number
9,140,998
Issue date
Sep 22, 2015
ASML Netherlands B.V.
Hendrik Jan Hidde Smilde
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Substrate, an inspection apparatus, and a lithographic apparatus
Patent number
9,081,304
Issue date
Jul 14, 2015
ASML Netherlands B.V.
Hendrik Jan Hidde Smilde
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Record carrier, playback apparatus and information system comprisin...
Patent number
RE44678
Issue date
Dec 31, 2013
Koninklijke Philips N.V.
Job Cornelis Oostveen
369 - Dynamic information storage or retrieval
Information
Patent Grant
Calibration method and apparatus
Patent number
8,553,218
Issue date
Oct 8, 2013
ASML Netherlands B.V.
Patricius Aloysius Jacobus Tinnemans
G01 - MEASURING TESTING
Information
Patent Grant
Scatterometry method and measurement system for lithography
Patent number
8,520,212
Issue date
Aug 27, 2013
ASML Netherlands B.V.
Willem Marie Julia Marcel Coene
G01 - MEASURING TESTING
Information
Patent Grant
Metrology method and apparatus, lithographic apparatus, device manu...
Patent number
8,411,287
Issue date
Apr 2, 2013
ASML Netherlands B.V.
Hendrik Jan Hidde Smilde
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method of determining overlay error and a device manufacturing method
Patent number
8,363,220
Issue date
Jan 29, 2013
ASML Netherlands B.V.
Willem Marie Julia Marcel Coene
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Interference-free LMS-based adaptive asynchronous receiver
Patent number
7,145,945
Issue date
Dec 5, 2006
Koninklijke Philips Electronics N.V.
David Modrie
G11 - INFORMATION STORAGE
Information
Patent Grant
Partial response maximum likelihood (PRML) bit detection apparatus
Patent number
7,065,161
Issue date
Jun 20, 2006
Koninklijke Philips Electronics N.V.
Willem M. J. Coene
G11 - INFORMATION STORAGE
Information
Patent Grant
Generation of amplitude levels for a partial response maximum likel...
Patent number
7,058,142
Issue date
Jun 6, 2006
Koninklijke Philips Electronics N.V.
Willem M.J. Coene
G11 - INFORMATION STORAGE
Information
Patent Grant
Slicer arrangement
Patent number
6,762,987
Issue date
Jul 13, 2004
Koninklijke Philips Electronics N.V.
Gerardus Rudolph Langereis
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
DIGITAL HOLOGRAPHIC MICROSCOPE AND ASSOCIATED METROLOGY METHOD
Publication number
20240160151
Publication date
May 16, 2024
ASML NETHERLANDS B.V.
Willem Marie Julia Marcel COENE
G02 - OPTICS
Information
Patent Application
METHODS AND APPARATUS FOR ACOUSTIC METROLOGY
Publication number
20240085379
Publication date
Mar 14, 2024
ASML NETHERLANDS B.V.
Mustafa Ümit ARABUL
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20230296533
Publication date
Sep 21, 2023
ASML NETHERLANDS B.V.
Nitish KUMAR
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Metrology System and Method for Determining a Characteristic of One...
Publication number
20230062585
Publication date
Mar 2, 2023
ASML NETHERLANDS B.V.
Patricius Aloysius Jacobus TINNEMANS
G01 - MEASURING TESTING
Information
Patent Application
DARK FIELD DIGITAL HOLOGRAPHIC MICROSCOPE AND ASSOCIATED METROLOGY...
Publication number
20230044632
Publication date
Feb 9, 2023
ASML NETHERLANDS B.V.
Willem Marie Julia Marcel COENE
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Metrology Method and Method for Training a Data Structure for Use i...
Publication number
20220309645
Publication date
Sep 29, 2022
ASML NETHERLANDS B.V.
Vasco Tomas TENNER
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METROLOGY METHOD AND APPARATUS FOR OF DETERMINING A COMPLEX-VALUED...
Publication number
20220299888
Publication date
Sep 22, 2022
ASML NETHERLANDS B.V.
Alexander Prasetya KONIJNENBERG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR IMAGE ANALYSIS
Publication number
20220026811
Publication date
Jan 27, 2022
ASML NETHERLANDS B.V.
Scott Anderson MIDDLEBROOKS
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
YIELD ESTIMATION AND CONTROL
Publication number
20210405545
Publication date
Dec 30, 2021
ASML NETHERLANDS B.V.
Scott Anderson MIDDLEBROOKS
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Metrology System and Method For Determining a Characteristic of one...
Publication number
20210003924
Publication date
Jan 7, 2021
ASML NETHERLANDS B.V.
Patricius Aloysius Jacobus TINNEMANS
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD AND APPARATUS FOR IMAGE ANALYSIS
Publication number
20200356009
Publication date
Nov 12, 2020
ASML NETHERLANDS B.V.
Scott Anderson MIDDLEBROOKS
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20200348244
Publication date
Nov 5, 2020
ASML NETHERLANDS B.V.
Nitish KUMAR
G01 - MEASURING TESTING
Information
Patent Application
YIELD ESTIMATION AND CONTROL
Publication number
20200257208
Publication date
Aug 13, 2020
ASML NETHERLANDS B.V.
Scott Anderson MIDDLEBROOKS
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OBJECT IDENTIFICATION AND COMPARISON
Publication number
20200072761
Publication date
Mar 5, 2020
ASML NETHERLANDS B.V.
Adrianus Cornelis Matheus KOOPMAN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR IMAGE ANALYSIS
Publication number
20190391498
Publication date
Dec 26, 2019
ASML NETHERLANDS B.V.
Scott Anderson MIDDLEBROOKS
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR DERIVING CORRECTIONS, METHOD AND APPARATUS...
Publication number
20190212660
Publication date
Jul 11, 2019
ASML NETHERLANDS B.V.
Nitish KUMAR
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Metrology System and Method For Determining a Characteristic of One...
Publication number
20190107781
Publication date
Apr 11, 2019
Stichting VU
Patricius Aloysius Jacobus TINNEMANS
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHODS AND APPARATUS FOR PREDICTING PERFORMANCE OF A MEASUREMENT M...
Publication number
20180224753
Publication date
Aug 9, 2018
ASML NETHERLANDS B.V.
Simon Gijsbert Josephus MATHIJSSEN
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
ALIGNMENT SYSTEM
Publication number
20180149987
Publication date
May 31, 2018
ASML NETHERLANDS B.V.
Simon Gijsbert Josephus MATHIJSSEN
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD AND APPARATUS FOR IMAGE ANALYSIS
Publication number
20170345138
Publication date
Nov 30, 2017
ASML NETHERLANDS B.V.
Scott Anderson MIDDLEBROOKS
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR IMAGE ANALYSIS
Publication number
20170336713
Publication date
Nov 23, 2017
ASML NETHERLANDS B.V.
Scott Anderson MIDDLEBROOKS
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Inspection Apparatus and Method, Lithographic Apparatus, Method of...
Publication number
20170261428
Publication date
Sep 14, 2017
ASML NETHERLANDS B.V.
Willem Marie Julia Marcel COENE
G01 - MEASURING TESTING
Information
Patent Application
YIELD ESTIMATION AND CONTROL
Publication number
20160313651
Publication date
Oct 27, 2016
Scott Anderson MIDDLEBROOKS
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Metrology Method and Inspection Apparatus, Lithographic System and...
Publication number
20160033877
Publication date
Feb 4, 2016
ASML NETHERLANDS B.V.
Hendrik Jan Hidde SMILDE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Substrate and Patterning Device for Use in Metrology, Metrology Met...
Publication number
20150331336
Publication date
Nov 19, 2015
ASML NETHERLANDS B.V.
Richard QUINTANILHA
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method Of Converting A User Bitstream Into Coded Bitstream, Method...
Publication number
20080094986
Publication date
Apr 24, 2008
Koninklijke Philips Electronics, N.V.
Willem Marie Julia Marcel Coene
G11 - INFORMATION STORAGE
Information
Patent Application
Coder and a Method of Coding for Codes Having a Rmtr Constraint of R=2
Publication number
20070257826
Publication date
Nov 8, 2007
Koninklijke Philips Electronics, N.V.
Willem Marie Julia Marcel Coene
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Method and device for reading information from optical disc
Publication number
20070242593
Publication date
Oct 18, 2007
Koninklijke Philips Electronics N.V.
Willem Marie Julia Marcel Coene
G11 - INFORMATION STORAGE
Information
Patent Application
DC-Controlled Encoding For Optical Storage System
Publication number
20070205933
Publication date
Sep 6, 2007
Koninklijke Philips Electronics, N.V.
Willem Marie Julia Marcel Coene
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Device And Method For Encoding A Secondary Information Of A Seconda...
Publication number
20070194970
Publication date
Aug 23, 2007
KONINKLIJKE PHILIPS ELECTROINCS N.V.
Willem Marie Julia Marcel Coene
G11 - INFORMATION STORAGE