William A. Hagerup

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Automatic probe ground connection checking techniques
- Patent number 11,454,651
- Issue date Sep 27, 2022
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Automatic probe ground connection checking techniques
- Patent number 11,249,111
- Issue date Feb 15, 2022
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
High impedance compliant probe tip
- Patent number 10,119,992
- Issue date Nov 6, 2018
- Tektronix, Inc.
- William A. Hagerup
- G01 - MEASURING TESTING
Information Patent Grant
Automatic probe ground connection checking techniques
- Patent number 10,041,975
- Issue date Aug 7, 2018
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Method for probe equalization
- Patent number 9,772,391
- Issue date Sep 26, 2017
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Grant
Automatic probe ground connection checking techniques
- Patent number 9,194,888
- Issue date Nov 24, 2015
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Calibrated S-parameter measurements of a high impedance probe
- Patent number 7,994,801
- Issue date Aug 9, 2011
- Tektronix, Inc.
- William A. Hagerup
- G01 - MEASURING TESTING
Information Patent Grant
Signal analysis system and calibration method
- Patent number 7,460,983
- Issue date Dec 2, 2008
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Grant
Variable attenuation signal acquisition probing and voltage measure...
- Patent number 7,424,177
- Issue date Sep 9, 2008
- Tektronix, Inc.
- Christopher P. Yakymyshyn
- G02 - OPTICS
Information Patent Grant
Wide bandwidth attenuator input circuit for a measurement probe
- Patent number 7,402,991
- Issue date Jul 22, 2008
- Tektronix, Inc.
- Ira G. Pollock
- G01 - MEASURING TESTING
Information Patent Grant
Variable attenuation signal acquisition probing and voltage measure...
- Patent number 7,310,455
- Issue date Dec 18, 2007
- Tektronix, Inc.
- Christopher P. Yakymyshyn
- G02 - OPTICS
Information Patent Grant
Wide bandwidth attenuator input circuit for a measurement probe
- Patent number 7,256,575
- Issue date Aug 14, 2007
- Tektronix, Inc.
- Ira G. Pollock
- G01 - MEASURING TESTING
Information Patent Grant
Micro-cavity laser having increased sensitivity
- Patent number 7,251,265
- Issue date Jul 31, 2007
- Tektronix, Inc.
- Christopher P. Yakymyshyn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Signal acquisition probing and voltage measurement systems using an...
- Patent number 7,221,813
- Issue date May 22, 2007
- Tektronix, Inc.
- Christopher P. Yakymyshyn
- G01 - MEASURING TESTING
Information Patent Grant
Signal acquisition probing system using a micro-cavity laser
- Patent number 7,187,187
- Issue date Mar 6, 2007
- Tektronix, Inc.
- Christopher P. Yakymyshyn
- G01 - MEASURING TESTING
Information Patent Grant
Attachable/detachable probing tip system for a measurement probing...
- Patent number 7,056,134
- Issue date Jun 6, 2006
- Tektronix, Inc.
- Jim L. Martin
- G01 - MEASURING TESTING
Information Patent Grant
Signal acquisition probing system using a micro-cavity laser capabl...
- Patent number 7,049,843
- Issue date May 23, 2006
- Tektronix, Inc.
- Christopher P. Yakymyshyn
- G01 - MEASURING TESTING
Information Patent Grant
Attachable/detachable variable spacing probing tip system
- Patent number 6,967,473
- Issue date Nov 22, 2005
- Tektronix, Inc.
- Gary W. Reed
- G01 - MEASURING TESTING
Information Patent Grant
Surface mount probe point socket and system
- Patent number 6,659,812
- Issue date Dec 9, 2003
- Tektronix, Inc.
- Marc A. Gessford
- G01 - MEASURING TESTING
Information Patent Grant
Low temperature co-fired ceramic substrate structure having a capac...
- Patent number 6,477,054
- Issue date Nov 5, 2002
- Tektronix, Inc.
- William A. Hagerup
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
High speed differential attenuator using a low temperature co-fired...
- Patent number 6,373,348
- Issue date Apr 16, 2002
- Tektronix, Inc.
- William A. Hagerup
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Automatic Probe Ground Connection Checking Techniques
- Publication number 20210088553
- Publication date Mar 25, 2021
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
Automatic Probe Ground Connection Checking Techniques
- Publication number 20180313870
- Publication date Nov 1, 2018
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
PROBE TIP AND PROBE ASSEMBLY
- Publication number 20180059139
- Publication date Mar 1, 2018
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT PROBE WITH ADJUSTABLE TEST POINT CONTACT
- Publication number 20170052216
- Publication date Feb 23, 2017
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
HIGH IMPEDANCE COMPLIANT PROBE TIP
- Publication number 20160291054
- Publication date Oct 6, 2016
- Tektronix, Inc.
- William A. Hagerup
- G01 - MEASURING TESTING
Information Patent Application
HIGH IMPEDANCE COMPLIANT PROBE TIP
- Publication number 20160187382
- Publication date Jun 30, 2016
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC PROBE GROUND CONNECTION CHECKING TECHNIQUES
- Publication number 20160077128
- Publication date Mar 17, 2016
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PROBE EQUALIZATION
- Publication number 20150212185
- Publication date Jul 30, 2015
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC PROBE GROUND CONNECTION CHECKING TECHNIQUES
- Publication number 20140103951
- Publication date Apr 17, 2014
- Daniel G. KNIERIM
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATED S-PARAMETER MEASUREMENTS OF A HIGH IMPEDANCE PROBE
- Publication number 20080278176
- Publication date Nov 13, 2008
- Tektronix, Inc.
- William A. HAGERUP
- G01 - MEASURING TESTING
Information Patent Application
Signal analysis system and calibration method
- Publication number 20080052028
- Publication date Feb 28, 2008
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
Wide Bandwidth Attenuator Input Circuit for a Measurement Probe
- Publication number 20070164730
- Publication date Jul 19, 2007
- Ira G. Pollock
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Wide Bandwidth Attenuator Input Circuit for a Measurement Probe
- Publication number 20070164731
- Publication date Jul 19, 2007
- Ira G. Pollock
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Variable Attenuation Signal Acquisition Probing and Voltage Measure...
- Publication number 20070154131
- Publication date Jul 5, 2007
- Tektronix, Inc.
- Christopher P. Yakymyshyn
- G02 - OPTICS
Information Patent Application
Calibration method and apparatus
- Publication number 20070041512
- Publication date Feb 22, 2007
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
Wide bandwidth attenuator input circuit for a measurement probe
- Publication number 20060284681
- Publication date Dec 21, 2006
- Ira G. Pollock
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Attachable/detachable probing tip system for a measurement probing...
- Publication number 20050266733
- Publication date Dec 1, 2005
- Jim L. Martin
- G01 - MEASURING TESTING
Information Patent Application
ATTACHABLE/DETACHABLE VARIABLE SPACING PROBING TIP SYSTEM
- Publication number 20050264276
- Publication date Dec 1, 2005
- Gary W. Reed
- G01 - MEASURING TESTING
Information Patent Application
Variable attenuation signal acquisition probing and voltage measure...
- Publication number 20050201658
- Publication date Sep 15, 2005
- Christopher P. Yakymyshyn
- G02 - OPTICS
Information Patent Application
Conductive electrode structure for an electro-optic material
- Publication number 20050201684
- Publication date Sep 15, 2005
- Christopher P. Yakymyshyn
- G02 - OPTICS
Information Patent Application
Micro-cavity laser having increased sensitivity
- Publication number 20050201425
- Publication date Sep 15, 2005
- Christopher P. Yakymyshyn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Signal acquisition probing system using a micro-cavity laser
- Publication number 20050200371
- Publication date Sep 15, 2005
- Christopher P. Yakymyshyn
- G01 - MEASURING TESTING
Information Patent Application
Signal acquisition probing system using a micro-cavity laser capabl...
- Publication number 20050200373
- Publication date Sep 15, 2005
- Christopher P. Yakymyshyn
- G01 - MEASURING TESTING
Information Patent Application
Optical cavity having increased sensitivity
- Publication number 20050201685
- Publication date Sep 15, 2005
- Christopher P. Yakymyshyn
- G02 - OPTICS
Information Patent Application
Signal acquisition probing and voltage measurement systems using an...
- Publication number 20050200362
- Publication date Sep 15, 2005
- Christopher P. Yakymyshyn
- G01 - MEASURING TESTING
Information Patent Application
Calibration method and apparatus
- Publication number 20050185768
- Publication date Aug 25, 2005
- John J. Pickerd
Information Patent Application
Calibration method and apparatus
- Publication number 20050185769
- Publication date Aug 25, 2005
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
SURFACE MOUNT PROBE POINT SOCKET AND SYSTEM
- Publication number 20030199208
- Publication date Oct 23, 2003
- Marc A. Gessford
- G01 - MEASURING TESTING

William A. Hagerup

Person

Patents Grantslast 30 patents

Automatic probe ground connection checking techniques

Automatic probe ground connection checking techniques

High impedance compliant probe tip

Automatic probe ground connection checking techniques

Method for probe equalization

Automatic probe ground connection checking techniques

Calibrated S-parameter measurements of a high impedance probe

Signal analysis system and calibration method

Variable attenuation signal acquisition probing and voltage measure...

Wide bandwidth attenuator input circuit for a measurement probe

Variable attenuation signal acquisition probing and voltage measure...

Wide bandwidth attenuator input circuit for a measurement probe

Micro-cavity laser having increased sensitivity

Signal acquisition probing and voltage measurement systems using an...

Signal acquisition probing system using a micro-cavity laser

Attachable/detachable probing tip system for a measurement probing...

Signal acquisition probing system using a micro-cavity laser capabl...

Attachable/detachable variable spacing probing tip system

Surface mount probe point socket and system

Low temperature co-fired ceramic substrate structure having a capac...

High speed differential attenuator using a low temperature co-fired...

Patents Applicationslast 30 patents

Automatic Probe Ground Connection Checking Techniques

Automatic Probe Ground Connection Checking Techniques

PROBE TIP AND PROBE ASSEMBLY

TEST AND MEASUREMENT PROBE WITH ADJUSTABLE TEST POINT CONTACT

HIGH IMPEDANCE COMPLIANT PROBE TIP

HIGH IMPEDANCE COMPLIANT PROBE TIP

AUTOMATIC PROBE GROUND CONNECTION CHECKING TECHNIQUES

METHOD FOR PROBE EQUALIZATION

AUTOMATIC PROBE GROUND CONNECTION CHECKING TECHNIQUES

CALIBRATED S-PARAMETER MEASUREMENTS OF A HIGH IMPEDANCE PROBE

Signal analysis system and calibration method

Wide Bandwidth Attenuator Input Circuit for a Measurement Probe

Wide Bandwidth Attenuator Input Circuit for a Measurement Probe

Variable Attenuation Signal Acquisition Probing and Voltage Measure...

Calibration method and apparatus

Wide bandwidth attenuator input circuit for a measurement probe

Attachable/detachable probing tip system for a measurement probing...

ATTACHABLE/DETACHABLE VARIABLE SPACING PROBING TIP SYSTEM

Variable attenuation signal acquisition probing and voltage measure...

Conductive electrode structure for an electro-optic material

Micro-cavity laser having increased sensitivity

Signal acquisition probing system using a micro-cavity laser

Signal acquisition probing system using a micro-cavity laser capabl...

Optical cavity having increased sensitivity

Signal acquisition probing and voltage measurement systems using an...

Calibration method and apparatus

Calibration method and apparatus

SURFACE MOUNT PROBE POINT SOCKET AND SYSTEM